17953624. MURA INSPECTION DEVICE FOR COMPRESSING MURA DATA THROUGH DIMENSIONALITY REDUCTION, OPERATING METHOD, AND DISPLAY SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
Contents
- 1 MURA INSPECTION DEVICE FOR COMPRESSING MURA DATA THROUGH DIMENSIONALITY REDUCTION, OPERATING METHOD, AND DISPLAY SYSTEM INCLUDING THE SAME
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 MURA INSPECTION DEVICE FOR COMPRESSING MURA DATA THROUGH DIMENSIONALITY REDUCTION, OPERATING METHOD, AND DISPLAY SYSTEM INCLUDING THE SAME - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Original Abstract Submitted
MURA INSPECTION DEVICE FOR COMPRESSING MURA DATA THROUGH DIMENSIONALITY REDUCTION, OPERATING METHOD, AND DISPLAY SYSTEM INCLUDING THE SAME
Organization Name
Inventor(s)
MURA INSPECTION DEVICE FOR COMPRESSING MURA DATA THROUGH DIMENSIONALITY REDUCTION, OPERATING METHOD, AND DISPLAY SYSTEM INCLUDING THE SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 17953624 titled 'MURA INSPECTION DEVICE FOR COMPRESSING MURA DATA THROUGH DIMENSIONALITY REDUCTION, OPERATING METHOD, AND DISPLAY SYSTEM INCLUDING THE SAME
Simplified Explanation
The abstract describes a mura inspection device that is used to detect and adjust distortions in a display region. The device includes an optical meter to measure the luminance of the display region and generate a first luminance matrix. A luminance preprocessor then detects distortion regions and adjusts the luminance to generate a second luminance matrix. A mura generator creates a mura matrix based on the difference between the second luminance matrix and a reference value. Finally, an encoder applies dimensionality reduction to the mura matrix to generate encoding data.
- Optical meter measures luminance of a display region and generates a first luminance matrix.
- Luminance preprocessor detects distortion regions and adjusts luminance to generate a second luminance matrix.
- Mura generator creates a mura matrix based on the difference between the second luminance matrix and a reference value.
- Encoder applies dimensionality reduction to the mura matrix to generate encoding data.
Potential Applications
This technology can be applied in various industries and scenarios, including:
- Display manufacturing: The mura inspection device can be used to detect and correct distortions in displays during the manufacturing process, ensuring high-quality products.
- Quality control: The device can be used in quality control processes to identify and fix mura defects in displays before they reach the market.
- Visual inspection: It can be used for visual inspection of displays in various applications, such as medical imaging, automotive displays, and consumer electronics.
Problems Solved
The mura inspection device addresses the following problems:
- Distortion detection: It provides an efficient and accurate method to detect distortions in display regions, allowing for timely adjustments and corrections.
- Quality assurance: By identifying and correcting mura defects, the device ensures that displays meet the required quality standards, reducing the likelihood of customer complaints and returns.
- Time and cost savings: The device automates the inspection process, reducing the need for manual inspection and potentially saving time and costs in manufacturing and quality control.
Benefits
The use of the mura inspection device offers several benefits:
- Improved display quality: By detecting and adjusting distortions, the device improves the overall quality of displays, resulting in better visual experiences for end-users.
- Enhanced efficiency: The automation of the inspection process increases efficiency, allowing for faster detection and correction of mura defects.
- Cost reduction: By minimizing the occurrence of mura defects, the device helps reduce costs associated with rework, returns, and customer dissatisfaction.
Original Abstract Submitted
A mura inspection device may include; an optical meter configured to measure luminance of a display region and generate a first luminance matrix, a luminance preprocessor configured to detect a distortion region of the display region in relation to the first luminance matrix, and generate a second luminance matrix by adjusting luminance of the distortion region, a mura generator configured to generate a mura matrix in relation to a difference between the second luminance matrix and a reference value, and an encoder configured to generate encoding data by applying dimensionality reduction to the mura matrix.
