17944437. BACKSIDE CONTACT WITH FULL WRAP-AROUND CONTACT simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)
BACKSIDE CONTACT WITH FULL WRAP-AROUND CONTACT
Organization Name
INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor(s)
Ruilong Xie of Niskayuna NY (US)
Kisik Choi of Watervliet NY (US)
Brent A. Anderson of Jericho VT (US)
Lawrence A. Clevenger of Saratoga Springs NY (US)
BACKSIDE CONTACT WITH FULL WRAP-AROUND CONTACT - A simplified explanation of the abstract
This abstract first appeared for US patent application 17944437 titled 'BACKSIDE CONTACT WITH FULL WRAP-AROUND CONTACT
Simplified Explanation
The semiconductor device described in the patent application features a source/drain with specific dimensions and a full wrap-around contact that surrounds a portion of the source/drain.
- The full wrap-around contact includes a frontside recessed wrap-around contact from the front side of the source/drain.
- Additionally, there is a backside conductive contact from the back side of the source/drain.
Potential Applications
This technology could be applied in the manufacturing of advanced semiconductor devices, such as transistors and integrated circuits.
Problems Solved
This innovation helps improve the electrical connectivity and performance of semiconductor devices by providing a more efficient and reliable contact structure.
Benefits
The full wrap-around contact design enhances the overall functionality and durability of the semiconductor device, leading to improved performance and longevity.
Potential Commercial Applications
Optimizing Contact Structures for Enhanced Semiconductor Devices
Original Abstract Submitted
A semiconductor device having a source/drain having a height, a length, and a width. A full wrap-around contact surrounds a partial length of the source/drain. The full wrap-around contact includes a frontside recessed wrap-around contact from a front side of the source/drain and a backside conductive contact from a back side of the source/drain.