17944326. METHOD AND DEVICE FOR ESTIMATING POSES AND MODELS OF OBJECT simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
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METHOD AND DEVICE FOR ESTIMATING POSES AND MODELS OF OBJECT
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METHOD AND DEVICE FOR ESTIMATING POSES AND MODELS OF OBJECT - A simplified explanation of the abstract
This abstract first appeared for US patent application 17944326 titled 'METHOD AND DEVICE FOR ESTIMATING POSES AND MODELS OF OBJECT
Simplified Explanation
The patent application describes a method for estimating the pose and model of an object in an image. Here is a simplified explanation of the abstract:
- The method starts by analyzing the input image to extract a global feature, which represents the overall characteristics of the image.
- It also considers a location code that contains information about the object's joint point and a vertex in a template model.
- Using the global feature and the location code, the method determines a local area feature that focuses on the object of interest.
- Finally, it extracts the location information of the object's joint point and the model vertex from the local area feature in the input image.
Potential applications of this technology:
- Object recognition and tracking in computer vision systems.
- Augmented reality applications that require accurate object pose estimation.
- Robotics and automation systems that need to identify and manipulate objects.
Problems solved by this technology:
- Accurately estimating the pose and model of objects in images can be challenging due to variations in lighting, viewpoint, and occlusions. This method aims to overcome these challenges.
- Traditional methods may require extensive computational resources and complex algorithms. This method offers a more efficient and simplified approach.
Benefits of this technology:
- Improved accuracy in object pose and model estimation.
- Faster and more efficient processing compared to traditional methods.
- Robustness to variations in lighting, viewpoint, and occlusions.
Original Abstract Submitted
An object pose and model estimation method includes acquiring a global feature of an input image, and a location code of an object including location information for a joint point of the object and location information for a model vertex in a template model; determining a local area feature of the object based on the global feature of the input image and based on the location code of the object in the template model; and acquiring location information for the joint point of the object in the input image and location information for the model vertex in the input image based on the local area feature of the object.
