17936608. SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION simplified abstract (Applied Materials, Inc.)
Contents
- 1 SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION
Organization Name
Inventor(s)
Eric Chin Hong Ng of Milpitas CA (US)
Todd J. Egan of Fremont CA (US)
Mehdi Vaez-iravani of Los Gatos CA (US)
SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION - A simplified explanation of the abstract
This abstract first appeared for US patent application 17936608 titled 'SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION
Simplified Explanation
The patent application describes a system that uses optical sensors to analyze the reflection and scattering of a radiation beam from an object's surface to determine its roughness or emissivity.
- The system includes a radiation source emitting a beam.
- A first optical sensor detects the intensity of reflected radiation.
- A second optical sensor detects the intensity of scattered radiation.
- A processing device compares the intensities to determine surface roughness or emissivity.
Potential Applications
This technology could be applied in industries such as manufacturing, quality control, and material science for surface analysis and characterization.
Problems Solved
This technology solves the problem of accurately and efficiently determining the roughness or emissivity of an object's surface without physical contact or invasive methods.
Benefits
The benefits of this technology include non-contact measurement, real-time analysis, and the ability to assess surface properties without altering the object being analyzed.
Potential Commercial Applications
One potential commercial application of this technology could be in the automotive industry for quality control of painted surfaces, where surface roughness and emissivity are critical factors.
Possible Prior Art
One possible prior art could be similar systems used in the field of remote sensing or spectroscopy for analyzing surface properties of objects.
Unanswered Questions
How does this technology compare to traditional methods of surface analysis?
This article does not provide a direct comparison between this technology and traditional methods such as contact profilometers or thermal imaging cameras.
What are the limitations of this technology in terms of surface materials or environmental conditions?
The article does not address the potential limitations of this technology when analyzing certain types of surfaces or when operating in extreme environmental conditions.
Original Abstract Submitted
A system includes a radiation source configured to emit a radiation beam. The system further includes a first optical sensor configured to detect a first intensity of a first portion of the radiation beam reflected from a surface of an object. The system further includes a second optical sensor configured to detect a second intensity of a second portion of the radiation beam scattered by the surface of the object. The system further includes a processing device communicatively coupled to the first optical sensor and the second optical sensor. The processing device is configured to determine at least one of a roughness or an emissivity of the surface of the object based on a comparison of the first intensity and the second intensity.
