17932751. CURRENT CONTROLLED VOLTAGE REGULATOR TESTING simplified abstract (Infineon Technologies AG)
Contents
- 1 CURRENT CONTROLLED VOLTAGE REGULATOR TESTING
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 CURRENT CONTROLLED VOLTAGE REGULATOR TESTING - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
CURRENT CONTROLLED VOLTAGE REGULATOR TESTING
Organization Name
Inventor(s)
Manfred Bresch of Villach (AT)
CURRENT CONTROLLED VOLTAGE REGULATOR TESTING - A simplified explanation of the abstract
This abstract first appeared for US patent application 17932751 titled 'CURRENT CONTROLLED VOLTAGE REGULATOR TESTING
Simplified Explanation
The disclosure involves using an externally-supplied control current to adjust an internal supply voltage generated by voltage regulator circuitry in an integrated circuit (IC) chip. This configuration establishes a linear relationship between the control current and the internal voltage supply, allowing for predictable and controllable adjustments to the supply voltage for testing purposes.
- The innovation enables setting the control current to a predetermined value, causing the supply voltage to deviate in a predictable manner, facilitating verification of the IC chip's internal voltage supply test circuitry.
- The use of a relatively small control current (e.g. on the order of microamps) allows for reusing existing on-chip test architecture designed to accommodate low level currents for selective routing of the control current for IC testing.
Potential Applications
This technology could be applied in the semiconductor industry for testing and verifying the internal voltage supply of IC chips during production.
Problems Solved
1. Facilitates verification of IC chip's internal voltage supply test circuitry. 2. Enables predictable and controllable adjustments to the supply voltage for testing purposes.
Benefits
1. Improved testing accuracy and reliability of IC chips. 2. Cost-effective utilization of existing on-chip test architecture for IC testing.
Potential Commercial Applications
Optimizing IC chip testing processes in semiconductor manufacturing for improved quality control and product reliability.
Possible Prior Art
One possible prior art could be the use of external control signals to adjust internal voltage supplies in IC chips for testing purposes.
Unanswered Questions
How does this technology impact the overall efficiency of IC chip testing processes in semiconductor manufacturing?
This technology can potentially streamline testing processes by enabling precise adjustments to the internal voltage supply of IC chips, leading to improved accuracy and reliability in testing results.
What are the potential limitations or challenges associated with implementing this technology in semiconductor manufacturing facilities?
Some potential challenges could include the need for specialized equipment or software to integrate the control current adjustment mechanism into existing testing protocols, as well as ensuring compatibility with different IC chip designs and configurations.
Original Abstract Submitted
The disclosure is directed to the use of an externally-supplied control current to control the adjustment of an internal supply voltage generated via voltage regulator circuitry, which may be identified with an integrated circuit (IC) chip. The configuration of the voltage regulator circuitry functions to establish a linear relationship between the control current and the internal voltage supply. This configuration enables setting the control current to a predetermined value, causing the supply voltage to deviate in a predictable and controllable manner, and thus facilitating verification of the IC chip's internal voltage supply test circuitry. Furthermore, because the control current used for this purpose is relatively small (e.g. on the order of microamps), existing on chip test architecture, which may accommodate such low level currents, may be re-used for the selective routing of the control current for such IC testing.
