17932691. MRAM TOP ELECTRODE STRUCTURE WITH LINER LAYER simplified abstract (International Business Machines Corporation)

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MRAM TOP ELECTRODE STRUCTURE WITH LINER LAYER

Organization Name

International Business Machines Corporation

Inventor(s)

Hsueh-Chung Chen of Cohoes NY (US)

Koichi Motoyama of Clifton Park NY (US)

Chanro Park of Clifton Park NY (US)

Yann Mignot of Slingerlands NY (US)

Chih-Chao Yang of Glenmont NY (US)

MRAM TOP ELECTRODE STRUCTURE WITH LINER LAYER - A simplified explanation of the abstract

This abstract first appeared for US patent application 17932691 titled 'MRAM TOP ELECTRODE STRUCTURE WITH LINER LAYER

Simplified Explanation

The semiconductor device described in the abstract includes a memory with a magnetic tunnel junction (MTJ) stack, an upper electrode, and dielectric layers.

  • The semiconductor device includes a memory with a magnetic tunnel junction (MTJ) stack.
  • The memory has an upper electrode on the MTJ stack.
  • At least one dielectric layer is formed around the memory.
  • A top metal layer contact hole is formed in the dielectric layer.
  • A dielectric liner layer is formed in the top metal contact hole.
  • A top metal layer contact is in the top metal layer contact hole.

Potential Applications

This technology could be applied in:

  • Non-volatile memory devices
  • Magnetic random-access memory (MRAM)
  • Data storage devices

Problems Solved

This technology helps in:

  • Improving memory storage capacity
  • Enhancing data retention and reliability
  • Reducing power consumption in memory devices

Benefits

The benefits of this technology include:

  • Faster data access and retrieval
  • Increased durability and longevity of memory devices
  • Enhanced performance and efficiency in data storage

Potential Commercial Applications

The potential commercial applications of this technology could be in:

  • Consumer electronics
  • Automotive systems
  • Industrial automation

Possible Prior Art

One possible prior art for this technology could be the development of MRAM technology in the semiconductor industry.

What are the specific materials used in the dielectric layer of the semiconductor device?

The specific materials used in the dielectric layer of the semiconductor device are not mentioned in the abstract.

How does the formation of the dielectric liner layer impact the performance of the memory device?

The formation of the dielectric liner layer helps in improving the electrical properties and reliability of the memory device by providing a barrier between the top metal layer contact and the surrounding dielectric material.


Original Abstract Submitted

A semiconductor device is provided. The semiconductor device includes a memory including a bottom electrode, a magnetic tunnel junction (MTJ) stack on the bottom electrode, and an upper electrode on the MTJ stack. The semiconductor device also includes at least one dielectric layer formed around the memory, wherein a top metal layer contact hole is formed in the at least one dielectric layer, a dielectric liner layer formed in the top metal contact hole, and a top metal layer contact in the top metal layer contact hole.