17900361. IDLE MODE TEMPERATURE CONTROL FOR MEMORY SYSTEMS simplified abstract (Micron Technology, Inc.)
Contents
IDLE MODE TEMPERATURE CONTROL FOR MEMORY SYSTEMS
Organization Name
Inventor(s)
Francesco Basso of Portici (NA) (IT)
Antonino Pollio of Vico Equense (NA) (IT)
Francesco Falanga of Quarto (NA) (IT)
Massimo Iaculo of San Marco Evangelista (CE) (IT)
IDLE MODE TEMPERATURE CONTROL FOR MEMORY SYSTEMS - A simplified explanation of the abstract
This abstract first appeared for US patent application 17900361 titled 'IDLE MODE TEMPERATURE CONTROL FOR MEMORY SYSTEMS
Simplified Explanation
Methods, systems, and devices for idle mode temperature control for memory systems are described in the patent application. The memory system may use dummy access commands to mitigate errors caused by temperature changes while in idle mode. By performing access commands, such as read commands, the memory device's temperature can be increased to maintain the desired operating temperature during idle mode. The memory system monitors the temperature of the memory device and issues dummy access commands if the temperature falls below a threshold, resulting in a temperature increase at the memory device.
- Memory system implements dummy access commands to control temperature during idle mode
- Access commands, like read commands, increase memory device temperature
- Temperature of memory device is monitored during idle mode
- Dummy access commands are issued if temperature falls below threshold
- Dummy access operations result in temperature increase at memory device
- Potential Applications
- Data centers - Servers - Embedded systems
- Problems Solved
- Preventing errors due to temperature changes in memory systems during idle mode
- Benefits
- Improved reliability of memory systems - Maintaining desired operating temperature - Preventing data loss due to temperature fluctuations
Original Abstract Submitted
Methods, systems, and devices for idle mode temperature control for memory systems are described. A memory system may implement the use of one or more dummy access commands to reduce the effects of errors introduced by temperature changes while the memory system is in an idle mode. For example, performing one or more access commands, such as one or more read commands, may increase a temperature of a memory device and support a desired operating temperature for the memory device while the memory system is in the idle mode. The memory system may measure the temperature of the memory device during the idle mode. If the memory system determines that the temperature of the memory device has fallen below a threshold temperature, the memory system may issue a quantity of dummy access commands to the memory device, and the corresponding dummy access operations may result in a temperature increase at the memory device.
