17882903. METHODS AND SYSTEMS FOR ESTIMATING DAMAGE RISK DUE TO DROP OF AN ELECTRONIC DEVICE simplified abstract (Samsung Electronics Co., Ltd.)

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METHODS AND SYSTEMS FOR ESTIMATING DAMAGE RISK DUE TO DROP OF AN ELECTRONIC DEVICE

Organization Name

Samsung Electronics Co., Ltd.

Inventor(s)

Prash Goel of Bengaluru (IN)

Kunal Aggarwal of Bengaluru (IN)

Gaurav Gupta of Bengaluru (IN)

Arindam Mondal of Bengaluru (IN)

Aniroop Mathur of Bengaluru (IN)

Archit Tekriwal of Bengaluru (IN)

METHODS AND SYSTEMS FOR ESTIMATING DAMAGE RISK DUE TO DROP OF AN ELECTRONIC DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 17882903 titled 'METHODS AND SYSTEMS FOR ESTIMATING DAMAGE RISK DUE TO DROP OF AN ELECTRONIC DEVICE

Simplified Explanation

The abstract describes a method for estimating the risk of damage to an electronic device when it is dropped on a surface. The method involves measuring the motion parameters of the device during the drop and classifying the surface it lands on. Based on the classified surface, the measured motion parameters, and the device's usage history, a damage risk score is estimated.

  • The method measures the motion parameters of an electronic device when it is dropped on a surface.
  • The surface is classified into different types using a classifier module.
  • The method takes into account the classified surface, the measured motion parameters, and the device's usage history to estimate a damage risk score.
  • The damage risk score indicates the level of risk for the electronic device to be damaged.

Potential Applications

  • This technology can be applied in the design and manufacturing of electronic devices to assess their durability and improve their resistance to damage.
  • It can be used in quality control processes to identify potential weaknesses or vulnerabilities in electronic devices.
  • The method can be integrated into mobile devices or protective cases to provide real-time feedback on the risk of damage when dropped on different surfaces.

Problems Solved

  • This technology addresses the problem of assessing the risk of damage to electronic devices when they are dropped on various surfaces.
  • It provides a quantitative measure of the damage risk level, allowing for better decision-making in terms of device design, manufacturing, and usage.

Benefits

  • By estimating the damage risk level, manufacturers can design more durable and robust electronic devices.
  • Users can make informed decisions about how to handle their devices based on the risk of damage associated with different surfaces.
  • The technology can help reduce the number of accidental damages to electronic devices, leading to cost savings for both manufacturers and users.


Original Abstract Submitted

Embodiments disclosed herein relate to electronic devices, and more particularly to estimating a damage risk level for an electronic device. A method disclosed herein includes measuring motion parameters of the electronic device, on the electronic device being dropped on a surface. The method further includes classifying the surface into at least one type by processing the measured motion parameters using a classifier module. The method further includes estimating a damage risk score depicting the damage risk level for the electronic device based on the classified surface, the measured motion parameters of the electronic device, and a usage history of the electronic device.

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