17875569. METHOD OF TESTING A SUSPEND OPERATION simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

From WikiPatents
Jump to navigation Jump to search

METHOD OF TESTING A SUSPEND OPERATION

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Suyong Kim of Hwaseong-si (KR)

Junyong Park of Seoul (KR)

Sangbum Yun of Seoul (KR)

Ilhan Park of Suwon-si (KR)

METHOD OF TESTING A SUSPEND OPERATION - A simplified explanation of the abstract

This abstract first appeared for US patent application 17875569 titled 'METHOD OF TESTING A SUSPEND OPERATION

Simplified Explanation

The abstract describes a method for testing a suspend operation, which involves determining when to transfer a suspend sampling signal to a suspend command circuit, generating an internal suspend operation command, and performing suspend operations at multiple suspend operation time points.

  • The method involves transferring a suspend sampling signal from a sequence operation circuit to a suspend command circuit.
  • An internal suspend operation command is generated based on the suspend sampling signal.
  • The internal suspend operation command is transferred from the suspend command circuit to the sequence operation circuit.
  • Suspend operations are performed for all the suspend operation time points in response to the internal suspend operation command.
  • The method includes determining whether the suspend operations are performed at all of the suspend operation time points.

Potential applications of this technology:

  • Testing and verification of suspend operations in electronic devices.
  • Quality control in manufacturing processes involving suspend operations.
  • Troubleshooting and debugging suspend-related issues in electronic systems.

Problems solved by this technology:

  • Ensures proper functioning of suspend operations by testing them at different time points.
  • Helps identify any failures or issues in suspend operations.
  • Provides a systematic method for testing suspend operations in electronic devices.

Benefits of this technology:

  • Improves the reliability and performance of suspend operations in electronic devices.
  • Reduces the risk of errors or malfunctions during suspend operations.
  • Facilitates efficient testing and verification of suspend operations in manufacturing processes.


Original Abstract Submitted

A method of testing a suspend operation, the method including: determining whether to transfer a suspend sampling signal to a suspend command circuit at a time point prior to each of a plurality of suspend operation time points stored in a sequence operation circuit; transferring the suspend sampling signal from the sequence operation circuit to the suspend command circuit; generating an internal suspend operation command based on the suspend sampling signal; transferring the internal suspend operation command from the suspend command circuit to the sequence operation circuit; performing suspend operations for all the plurality of suspend operation time points in response to the internal suspend operation command; and determining whether the suspend operations are performed at all of the suspend operation time points.