17873385. SEMICONDUCTOR DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
Contents
SEMICONDUCTOR DEVICE
Organization Name
Inventor(s)
Bonggyu Kang of Yongin-si (KR)
Youngmin Ku of Seongnam-si (KR)
SEMICONDUCTOR DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 17873385 titled 'SEMICONDUCTOR DEVICE
Simplified Explanation
The patent application describes a semiconductor device with an internal circuit connected to at least one pad. It includes a first inductor element connected between the pad and the internal circuit, and a second inductor element coupled to the first inductor element.
- The second inductor element generates an induced voltage when there is an overcurrent flowing in the first inductor element.
- An event detection circuit is included, which has a monitoring element connected to the second inductor element.
- The monitoring element senses changes in its properties caused by the induced voltages in the second inductor element or the current flowing in it.
- The monitoring element generates an event detection signal based on these changes.
- The internal circuit receives the event detection signal and determines whether an event causing the overcurrent has occurred.
Potential applications of this technology:
- This technology can be used in various semiconductor devices such as integrated circuits, microprocessors, and power management systems.
- It can be particularly useful in devices where overcurrent events need to be detected and analyzed.
Problems solved by this technology:
- The technology helps in detecting overcurrent events, which can be caused by various factors such as short circuits or power surges.
- By detecting these events, the internal circuit can take appropriate actions to protect the device and prevent any damage.
Benefits of this technology:
- The technology provides a reliable and efficient method for detecting overcurrent events.
- It allows for quick identification of events causing overcurrent, enabling timely response and protection of the device.
- The use of inductor elements and monitoring circuits enhances the accuracy and sensitivity of the detection system.
Original Abstract Submitted
A semiconductor device includes an internal circuit connected to at least one pad. A first inductor element is connected between the at least one pad and the internal circuit, a second inductor element coupled to the first inductor element and generating an induced voltage due to an overcurrent flowing in the first inductor element. An event detection circuit includes a monitoring element connected to the second inductor element. The monitoring element is configured to generate an event detection signal by sensing changes in properties of the monitoring element caused by at least one of the induced voltages generated in the second inductor element and a current flowing in the second inductor element. The internal circuit supplies an operating voltage to the event detection circuit, and determines whether an event causing the overcurrent has occurred by receiving the event detection signal from the event detection circuit.
