17870096. STORAGE CONTROLLER AND ELECTRONIC SYSTEM simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

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STORAGE CONTROLLER AND ELECTRONIC SYSTEM

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Junyong Uhm of Seoul (KR)

Eunjoo Oh of Suwon-si (KR)

Junggyu Kim of Hwaseong-si (KR)

Jaesub Kim of Seoul (KR)

Yangwoo Roh of Hwaseong-si (KR)

Jeongbeom Seo of Seoul (KR)

Jaewon Song of Hwaseong-si (KR)

STORAGE CONTROLLER AND ELECTRONIC SYSTEM - A simplified explanation of the abstract

This abstract first appeared for US patent application 17870096 titled 'STORAGE CONTROLLER AND ELECTRONIC SYSTEM

Simplified Explanation

The abstract describes an electronic system that includes a host and a storage device. The host sends a fault insertion command to the storage device, specifying a fault type, target location, and fault condition. The storage device performs a fault detection operation on the target location based on the fault type and stores a snapshot when the fault condition is detected. The host can then obtain the snapshot and debug the storage device.

  • The electronic system includes a host and a storage device.
  • The host sends a fault insertion command to the storage device.
  • The fault insertion command includes a fault type, target location, and fault condition.
  • The storage device performs a fault detection operation on the target location.
  • The fault detection operation is selected based on the fault type.
  • The storage device stores a snapshot when the fault condition is detected.
  • The host can obtain the stored snapshot using an interface protocol.
  • The host can debug the storage device using the obtained snapshot.

Potential Applications

  • Debugging and troubleshooting electronic systems.
  • Testing and validating storage devices.
  • Improving the reliability and performance of storage devices.

Problems Solved

  • Facilitates fault detection and debugging of storage devices.
  • Provides a mechanism for capturing snapshots of storage devices during fault conditions.
  • Enables efficient testing and validation of storage devices.

Benefits

  • Streamlines the debugging process for storage devices.
  • Reduces the time and effort required to identify and fix faults.
  • Enhances the reliability and performance of storage devices.


Original Abstract Submitted

An electronic system includes: a host; and a storage device configured to exchange data with the host using an interface protocol. The host provides a fault insertion command, including a fault type, a target location, and a fault condition, to the storage device, based on the interface protocol. The storage device performs a fault detection operation, selected based on the fault type among an assert code execution operation, a memory polling operation, an interrupt polling operation, and a latency detection operation, on the target location in response to the fault insertion command, and stores a snapshot of the storage device when the fault condition is detected as a result of performing the fault detection operation. The host obtains the stored snapshot using the interface protocol, and debugs the storage device using the obtained snapshot.

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