17860188. STORAGE WORKLOAD ALLOCATION BASED ON INPUT/OUTPUT PATTERN AFFINITY CALCULATIONS simplified abstract (Dell Products L.P.)
STORAGE WORKLOAD ALLOCATION BASED ON INPUT/OUTPUT PATTERN AFFINITY CALCULATIONS
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STORAGE WORKLOAD ALLOCATION BASED ON INPUT/OUTPUT PATTERN AFFINITY CALCULATIONS - A simplified explanation of the abstract
This abstract first appeared for US patent application 17860188 titled 'STORAGE WORKLOAD ALLOCATION BASED ON INPUT/OUTPUT PATTERN AFFINITY CALCULATIONS
Simplified Explanation
The patent application describes an apparatus that can identify storage workloads and determine the types of input/output (IO) patterns associated with these workloads. It calculates an affinity metric to measure the difference in performance when these IO patterns are run concurrently compared to when they are run individually. Based on this metric, the apparatus allocates the storage workloads to specific storage devices in the system.
- The apparatus can identify storage workloads and their associated IO patterns.
- It calculates an affinity metric to measure the difference in performance when running different IO patterns concurrently.
- Based on the affinity metric, the apparatus allocates the storage workloads to specific storage devices.
Potential Applications
- This technology can be applied in storage systems to optimize the allocation of storage workloads.
- It can improve the overall performance and efficiency of storage systems by allocating workloads based on their affinity metrics.
Problems Solved
- The apparatus solves the problem of inefficient allocation of storage workloads in storage systems.
- It addresses the challenge of determining the best combination of IO patterns to run concurrently for optimal performance.
Benefits
- The technology improves the performance and efficiency of storage systems by allocating workloads based on their affinity metrics.
- It allows for better utilization of storage devices by optimizing the allocation of workloads.
- The apparatus can help reduce bottlenecks and improve overall system performance.
Original Abstract Submitted
An apparatus comprises a processing device configured to identify storage workloads to be run on a storage system, and to determine a mix of input/output (TO) patterns associated with the identified storage workloads, the mix of IO patterns comprising a first set of IO patterns characterizing types of IO operations performed by a first storage workload and at least a second set of IO patterns characterizing types of IO operations performed by a second storage workload. The processing device is also configured to calculate an affinity metric for the mix of IO patterns, the calculated affinity metric characterizing a difference between (i) performance metrics for the mix of IO patterns running concurrently and (ii) the first and second sets of IO patterns running individually. The processing device is further configured to allocate the identified storage workloads to storage devices of the storage system based on the calculated affinity metric.
