17846423. ENHANCED POWER AND SIGNAL FOR STACKED-FETS simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)

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ENHANCED POWER AND SIGNAL FOR STACKED-FETS

Organization Name

INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor(s)

Albert M. Young of Fishkill NY (US)

Albert M. Chu of Nashua NH (US)

Junli Wang of Slingerlands NY (US)

ENHANCED POWER AND SIGNAL FOR STACKED-FETS - A simplified explanation of the abstract

This abstract first appeared for US patent application 17846423 titled 'ENHANCED POWER AND SIGNAL FOR STACKED-FETS

Simplified Explanation

Abstract

A semiconductor structure has been developed to address the shorting risks associated with using long bars in advanced logic applications. This structure, which utilizes stacked field effect transistor technology with unequal device footprints, provides a reliable power rail that can mitigate or eliminate these risks.

Patent/Innovation Explanation

  • The semiconductor structure is designed for advanced logic applications.
  • It utilizes stacked field effect transistor technology.
  • The structure includes unequal device footprints to address shorting risks.
  • A reliable power rail is provided to mitigate or eliminate these risks.

Potential Applications

This technology has potential applications in various fields, including:

  • Advanced logic applications
  • Semiconductor manufacturing
  • Electronics industry

Problems Solved

The semiconductor structure addresses the following problems:

  • Shorting risks associated with using long bars in advanced logic applications
  • Reliability issues in power rails

Benefits

The benefits of this technology include:

  • Mitigation or elimination of shorting risks
  • Improved reliability in power rails
  • Enhanced performance in advanced logic applications


Original Abstract Submitted

A semiconductor structure including a reliable power rail in stacked field effect transistor technology with unequal device footprints is provided that mitigates, and in some cases even eliminates, shorting risks that are typically associated using long bars in advanced logic applications.

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