17839343. CHARGED PARTICLE FILTER AND REMOVAL SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)

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CHARGED PARTICLE FILTER AND REMOVAL SYSTEM

Organization Name

Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor(s)

En Tian Lin of Hsinchu (TW)

Chiao Ling Weng of Hsinchu (TW)

CHARGED PARTICLE FILTER AND REMOVAL SYSTEM - A simplified explanation of the abstract

This abstract first appeared for US patent application 17839343 titled 'CHARGED PARTICLE FILTER AND REMOVAL SYSTEM

Simplified Explanation

The patent application describes a filter that uses two conductive meshes to remove contaminants from a fluid. The first conductive mesh is positively charged, while the second conductive mesh is negatively charged. Anions in the fluid or generated by an electrical field between the meshes interact with the contaminants, attracting them to the meshes.

  • The filter uses two oppositely charged conductive meshes to remove contaminants from a fluid.
  • The first mesh is positively charged, and the second mesh is negatively charged.
  • Anions in the fluid or generated by an electrical field between the meshes interact with the contaminants, attracting them to the meshes.

Potential Applications

  • Water purification systems
  • Air filtration systems
  • Industrial filtration processes

Problems Solved

  • Efficient removal of contaminants from fluids
  • Enhanced filtration performance
  • Reduction of contaminants in water or air

Benefits

  • Improved filtration efficiency
  • Lower maintenance requirements
  • Enhanced purification of fluids


Original Abstract Submitted

The present disclosure is directed to at least one embodiment of a filter that is configured to remove contaminants utilizing a first conductive mesh (e.g., first electrode) and a second conductive mesh (e.g., second electrode) that extends around the first conductive mesh. For example, the first conductive mesh may receive a first electrical signal and the second conductive mesh may receive a second electrical signal such that the first and second conductive meshes are oppositely charged from each other (e.g., the first conductive mesh is positively charged and the second conductive mesh is negatively charged). Anions that are present within the fluid or generated by an electrical field between the first and second conductive meshes may interact with the contaminants such that the contaminants are attracted to at least one of the first and second conductive meshes, respectively.