17836463. METHOD FOR FILLING TRENCH IN SEMICONDUCTOR DEVICE simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)

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METHOD FOR FILLING TRENCH IN SEMICONDUCTOR DEVICE

Organization Name

Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor(s)

Kenichi Sano of Hsinchu (TW)

Andrew Joseph Kelly of Hsinchu (TW)

Yu-Wei Lu of Hsinchu (TW)

Chin-Hsiang Lin of Hsinchu (TW)

Chia-Yun Cheng of Hsinchu (TW)

METHOD FOR FILLING TRENCH IN SEMICONDUCTOR DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 17836463 titled 'METHOD FOR FILLING TRENCH IN SEMICONDUCTOR DEVICE

Simplified Explanation

The patent application describes a method for coating a semiconductor structure in a semiconductor device using a multi-step procedure. Here are the key points:

  • The method involves applying a first solution containing a metal-containing solute onto the semiconductor structure, which includes a feature and a trench.
  • The first solution forms a first coating that covers both the feature and the trench.
  • The first coating is then heated in a multi-step procedure, starting at a first temperature and then increasing to a second temperature that is not lower than the first temperature.
  • This heating process transforms the first coating into a first film.
  • Next, a second solution containing the same metal-containing solute is applied onto the first film to form a second coating.
  • Similar to the first coating, the second coating is heated in a multi-step procedure, starting at a third temperature and then increasing to a fourth temperature that is not lower than the third temperature.
  • This heating process transforms the second coating into a second film.

Potential applications of this technology:

  • Semiconductor manufacturing industry
  • Electronics industry
  • Integrated circuit fabrication

Problems solved by this technology:

  • Provides a method for coating semiconductor structures with a metal-containing solute, ensuring uniform coverage over features and trenches.
  • Enables the formation of films through a multi-step heating procedure, enhancing the stability and durability of the coatings.

Benefits of this technology:

  • Improved coating process for semiconductor structures, leading to enhanced performance and reliability of semiconductor devices.
  • Enables the creation of uniform and durable films, reducing the risk of defects and improving overall device functionality.


Original Abstract Submitted

A method includes: applying a first solution to a semiconductor structure of a semiconductor device to form a first coating, the semiconductor structure including a feature and the trench, the first coating being formed in the trench and over the feature, the first solution containing a metal-containing solute; heating the first coating in a multi-step procedure to turn the first coating into a first film, the multi-step procedure including heating at a first temperature, followed by heating at a second temperature not lower than the first temperature; applying a second solution onto the first film to form a second coating, the second solution containing the metal-containing solute; and heating the second coating in a multi-step procedure to turn the second coating into a second film, the multi-step procedure including heating at a third temperature, followed by heating at a fourth temperature not lower than the third temperature.