17830488. SEMICONDUCTOR PACKAGE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

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SEMICONDUCTOR PACKAGE

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Yong Ho Kim of Hwaseong-si (KR)

Woo Jin Jang of Seoul (KR)

Jeong Hoon Ahn of Seongnam-si (KR)

Yun Ki Choi of Yongin-si (KR)

SEMICONDUCTOR PACKAGE - A simplified explanation of the abstract

This abstract first appeared for US patent application 17830488 titled 'SEMICONDUCTOR PACKAGE

Simplified Explanation

The patent application describes a semiconductor package that includes two chip substrates connected through a connection bump. The connection bump's width increases as it moves away from the first surface of the first chip substrate.

  • The semiconductor package includes a first chip substrate with a through via passing through it.
  • An upper passivation layer on the second surface of the first chip substrate exposes a portion of the second surface.
  • An upper pad on the trench of the upper passivation layer is electrically connected to the through via.
  • A second chip substrate with a lower pad is connected to the first chip substrate.
  • The connection bump electrically connects the upper pad with the lower pad and widens as it moves away from the first chip substrate's surface.

Potential Applications

  • Semiconductor packaging industry
  • Electronic devices manufacturing

Problems Solved

  • Improved electrical connection between chip substrates
  • Enhanced performance and reliability of semiconductor packages

Benefits

  • Better electrical connectivity between chip substrates
  • Increased performance and reliability of semiconductor packages
  • Improved manufacturing efficiency and cost-effectiveness


Original Abstract Submitted

Provided is a semiconductor package including a first chip substrate including a first surface and a second surface, a through via passing through the first chip substrate, an upper passivation layer including a trench on the second surface of the first chip substrate, the trench exposing at least a portion of the second surface of the first chip substrate, an upper pad electrically connected with the through via on the trench, a second chip substrate including a third surface and a fourth surface, a lower pad electrically connected to the second chip substrate on the third surface of the second chip substrate, and a connection bump electrically connecting the upper pad with the lower pad and contacting the lower pad, wherein a width of the connection bump increases as the connection bump becomes farther away from the first surface of the first chip substrate.