17809474. REPEATED NONDESTRUCTIVE PHOTODETECTOR READOUT ASSESSMENTS simplified abstract (Microsoft Technology Licensing, LLC)

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REPEATED NONDESTRUCTIVE PHOTODETECTOR READOUT ASSESSMENTS

Organization Name

Microsoft Technology Licensing, LLC

Inventor(s)

Cyrus Soli Bamji of Fremont CA (US)

REPEATED NONDESTRUCTIVE PHOTODETECTOR READOUT ASSESSMENTS - A simplified explanation of the abstract

This abstract first appeared for US patent application 17809474 titled 'REPEATED NONDESTRUCTIVE PHOTODETECTOR READOUT ASSESSMENTS

Simplified Explanation

The abstract describes an image sensor that includes a photo detector and a readout structure. The photo detector accumulates photo charges in response to incident photons during an integration period, while the readout structure assesses the amount of minority carrier photo charges accumulated at the photo detector.

  • The image sensor includes a photo detector and a readout structure.
  • The photo detector accumulates photo charges in response to incident photons during an integration period.
  • The readout structure repeatedly and nondestructively assesses the amount of minority carrier photo charges accumulated at the photo detector during the integration period.

Potential Applications

  • Digital cameras
  • Surveillance systems
  • Medical imaging devices
  • Machine vision systems

Problems Solved

  • Accurate measurement of photo charges accumulated at the photo detector
  • Nondestructive assessment of minority carrier photo charges
  • Efficient integration of incident photons

Benefits

  • Improved image quality
  • Higher sensitivity to light
  • Enhanced dynamic range
  • Reduced noise levels


Original Abstract Submitted

An image sensor is disclosed. The image sensor includes a photo detector and a readout structure electronically coupled to the photodetector. The photodetector is configured to accumulate one or more photo charges responsive to one or more incident photons during an integration period. The readout structure is configured to repeatedly and nondestructively assess an amount of minority carrier photo charges accumulated at the photodetector during the integration period.