17808357. INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICS simplified abstract (QUALCOMM Incorporated)

From WikiPatents
Jump to navigation Jump to search

INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICS

Organization Name

QUALCOMM Incorporated

Inventor(s)

Chengyue Yu of San Diego CA (US)

Hua Guan of San Diego CA (US)

Yingjie Chen of Atlanta GA (US)

Fan Yang of Singapore (SG)

Yufei Pan of Singapore (SG)

Jize Jiang of Singapore (SG)

Shamim Ahmed of Mesa AZ (US)

INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICS - A simplified explanation of the abstract

This abstract first appeared for US patent application 17808357 titled 'INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICS

Simplified Explanation

The patent application describes an apparatus and techniques for an integrated circuit (IC) package to automatically detect external component parameters and parasitics through an input/output pin.

  • The IC package includes a pin that connects to an external component.
  • The package has a resistance detector, an inductance detector, or a capacitance detector coupled to the pin.
  • The detectors are configured to detect the resistance, inductance, or capacitance of the external component.
  • The detectors can also detect parasitics associated with the component, pin, or their connection.

Potential Applications:

  • Integrated circuits and electronic devices that require accurate knowledge of external component parameters and parasitics.
  • Testing and calibration of electronic systems that involve external components.
  • Circuit design and optimization by providing accurate information about the external components.

Problems Solved:

  • Manual detection and measurement of external component parameters and parasitics can be time-consuming and prone to errors.
  • Lack of accurate information about external component parameters can lead to suboptimal circuit performance.
  • Difficulty in identifying and mitigating parasitics in the circuit.

Benefits:

  • Automatic detection of external component parameters and parasitics saves time and reduces errors.
  • Accurate information about external component parameters enables better circuit design and optimization.
  • Identification and mitigation of parasitics improves circuit performance and reliability.


Original Abstract Submitted

Apparatus and techniques for an integrated circuit (IC) package to automatically detect, through an input/out pin, external component parameters and parasitics. An example IC package generally includes a pin for coupling to a component external to the IC package, and at least one of a resistance detector, an inductance detector, or a capacitance detector coupled to the pin, and configured to detect at least one of a resistance, an inductance, or a capacitance, respectively, of a lumped parameter model for the component external to the IC package. The resistance detector, inductance detector, or capacitance detector may also be configured to detect parasitics associated with at least one of the component, the pin, or a connection between the component and the pin.

Retrieved from "http://wikipatents.org/index.php?title=17808357._INTEGRATED_CIRCUIT_PACKAGE_WITH_INTERNAL_CIRCUITRY_TO_DETECT_EXTERNAL_COMPONENT_PARAMETERS_AND_PARASITICS_simplified_abstract_(QUALCOMM_Incorporated)&oldid=16892"