17766308. GAIT MEASUREMENT SYSTEM, GAIT MEASUREMENT METHOD, AND PROGRAM RECORDING MEDIUM simplified abstract (NEC Corporation)
GAIT MEASUREMENT SYSTEM, GAIT MEASUREMENT METHOD, AND PROGRAM RECORDING MEDIUM
Organization Name
Inventor(s)
Kenichiro Fukushi of Tokyo (JP)
GAIT MEASUREMENT SYSTEM, GAIT MEASUREMENT METHOD, AND PROGRAM RECORDING MEDIUM - A simplified explanation of the abstract
This abstract first appeared for US patent application 17766308 titled 'GAIT MEASUREMENT SYSTEM, GAIT MEASUREMENT METHOD, AND PROGRAM RECORDING MEDIUM
Simplified Explanation
The patent application describes a gait measurement system that includes a data acquisition device for measuring physical quantities related to pressures of the left and right feet, and a calculation device for calculating the symmetry of walking using these pressure measurements.
- Data acquisition device measures physical quantities related to pressures of left and right feet
- Calculation device calculates symmetry of walking based on pressure measurements
Potential Applications
- Physical therapy and rehabilitation
- Sports performance analysis
- Monitoring and improving gait patterns in elderly individuals
Problems Solved
- Accurate measurement of gait symmetry
- Objective assessment of walking patterns
- Early detection of gait abnormalities
Benefits
- Personalized treatment plans
- Enhanced performance optimization
- Improved quality of life for individuals with gait disorders
Original Abstract Submitted
A gait measurement system including: a data acquisition device that measures physical quantities related to pressures of left and right feet; and a calculation device that calculates a symmetry of walking using the physical quantities related to the pressures of the left and right feet.
