17738272. TEST SOCKET FOR PERFORMING A TEST ON AN ELECTRONIC DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
TEST SOCKET FOR PERFORMING A TEST ON AN ELECTRONIC DEVICE
Organization Name
Inventor(s)
Kiljoong Yun of Hwaseong-si (KR)
Kwangkyu Bang of Hwaseong-si (KR)
Jaegyu Choi of Seongnam-si (KR)
TEST SOCKET FOR PERFORMING A TEST ON AN ELECTRONIC DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 17738272 titled 'TEST SOCKET FOR PERFORMING A TEST ON AN ELECTRONIC DEVICE
Simplified Explanation
The abstract describes a test socket for testing samples with multiple test terminals. The test socket includes a first body for fixing the sample, a second body that rotates relative to the first body, a test board on the second body with openings, and interface pins that penetrate through the openings to make contact with the test terminals.
- The test socket is designed to receive a sample with multiple test terminals.
- The second body of the socket can rotate relative to the first body.
- The test board on the second body is used to test the sample.
- The test board has openings through which interface pins penetrate.
- Each interface pin consists of a contact pin and a spring.
- The contact pin makes contact with a test terminal of the sample.
- The spring provides elastic support to the contact pin.
Potential Applications
- Testing electronic components or devices with multiple test terminals.
- Quality control and testing in manufacturing processes.
- Research and development of new products.
Problems Solved
- Provides a secure and reliable connection between the test socket and the sample.
- Allows for easy testing of samples with multiple test terminals.
- Facilitates efficient and accurate testing of electronic components.
Benefits
- Simplifies the testing process by providing a dedicated socket for testing.
- Enables rotation of the second body for easy access to the test board.
- Ensures reliable contact between the interface pins and the test terminals.
- Provides elastic support to prevent damage to the test terminals during testing.
Original Abstract Submitted
A test socket includes: a first body including a fixing portion configured to receive a sample having a plurality of test terminals; a second body facing the first body and coupled with the first body such that the second body rotates relative to the first body about a hinge pin; a test board provided on the second body and configured to test the sample, wherein the test board has a plurality of first openings provided therein; and a plurality of interface pins penetrating through the first openings, wherein each of the plurality of interface pins includes a contact pin and a spring, wherein the contact pin is provided in a first end portion of each of the plurality of interface pin and is configured to come into contact with a test terminal of the plurality of test terminals, and the spring elastically supports the contact pin.
