17718754. TRAY AND DESTRUCTIVE ANALYSIS AUTOMATION APPARATUS INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

TRAY AND DESTRUCTIVE ANALYSIS AUTOMATION APPARATUS INCLUDING THE SAME

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Youn Gon Oh of Hwaseong-si (KR)

Ji Hun Kim of Uiwang-si (KR)

SaeYun Ko of Hwaseong-si (KR)

Gil Ho Gu of Hwaseong-si (KR)

Dong Su Kim of Incheon (KR)

Eun Hee Lee of Hwaseong-si (KR)

Ho Chan Lee of Seoul (KR)

Seong Sil Jeong of Incheon (KR)

Seong Pyo Hong of Hwaseong -si (KR)

TRAY AND DESTRUCTIVE ANALYSIS AUTOMATION APPARATUS INCLUDING THE SAME - A simplified explanation of the abstract

This abstract first appeared for US patent application 17718754 titled 'TRAY AND DESTRUCTIVE ANALYSIS AUTOMATION APPARATUS INCLUDING THE SAME

Simplified Explanation

The abstract of the patent application describes a tray that includes a plate with two regions, a first groove on one region to hold test wafer pieces, and a second groove on the other region to hold a test sample.

• The tray includes a plate with two regions - a first region and a second region.
• The first region of the plate has a first groove to which a stub is fixed.
• The stub is designed to store test wafer pieces.
• The second region of the plate has a second groove to which a grid holder is fixed.
• The grid holder is designed to store a test sample.

Potential applications of this technology:

• This tray can be used in semiconductor manufacturing processes for testing and analyzing wafer pieces.
• It can be used in research laboratories for conducting experiments and tests on various samples.

Problems solved by this technology:

• The tray provides a convenient and organized way to store and handle test wafer pieces and test samples.
• It ensures that the test wafer pieces and test samples are securely held in place during testing and analysis.

Benefits of this technology:

• The tray allows for efficient and accurate testing and analysis of wafer pieces and samples.
• It simplifies the process of handling and storing test wafer pieces and samples.
• The organized design of the tray reduces the risk of misplacement or damage to the test wafer pieces and samples.

Original Abstract Submitted

Provided is a tray including a plate including a first region and a second region, a first groove on the first region of the plate and to which a stub is fixed, and a second groove on the second region of the plate and to which a grid holder is fixed, wherein the stub is configured to store test wafer pieces, and wherein the grid holder is configured to store a test sample.