17701065. FAULT DETECTION DISPLAY APPARATUS AND OPERATION METHOD THEREOF simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

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FAULT DETECTION DISPLAY APPARATUS AND OPERATION METHOD THEREOF

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Yilho Lee of Seoul (KR)

Yongil Kwon of Suwon-si (KR)

Sugyeung Kang of Suwon-si (KR)

Tae-Hyeon Kwon of Seoul (KR)

Sunkwon Kim of Hwaseong-si (KR)

Hyunsang Park of Seongnam-si (KR)

Uijong Song of Suwon-si (KR)

FAULT DETECTION DISPLAY APPARATUS AND OPERATION METHOD THEREOF - A simplified explanation of the abstract

This abstract first appeared for US patent application 17701065 titled 'FAULT DETECTION DISPLAY APPARATUS AND OPERATION METHOD THEREOF

Simplified Explanation

The abstract describes an integrated circuit panel that is capable of detecting faults in a driving circuit. The panel includes a driving circuit array, a data driver, a switch driver, and an error detection driver.

  • The driving circuit array consists of two driving circuits.
  • The data driver is responsible for outputting input data signals through data lines.
  • The switch driver outputs a switching signal through a switch line.
  • The error detection driver receives output data signals through test lines.
  • When the switching signal is received, the driving circuits output output data signals through the test lines.
  • The error detection driver then detects any faults in the driving circuits based on the output data signals.

Potential applications of this technology:

  • Integrated circuit testing and fault detection
  • Quality control in manufacturing processes
  • Circuitry monitoring and diagnostics

Problems solved by this technology:

  • Efficient and accurate detection of faults in driving circuits
  • Streamlined testing process for integrated circuits
  • Early identification of potential issues in circuitry

Benefits of this technology:

  • Improved reliability and performance of integrated circuits
  • Cost savings through early detection and prevention of faults
  • Enhanced productivity in manufacturing processes


Original Abstract Submitted

Disclosed is integrated circuit panel which detects fault of a driving circuit. The integrated circuit panel includes: a driving circuit array including first and second driving circuits; a data driver configured to output first and second input data signals through first and second data lines, respectively; a switch driver configured to output a switching signal through a switch line; and an error detection driver configured to receive first and second output data signals through first and second test lines, respectively, wherein, in response to the switching signal, the first and second driving circuits are configured to output the first and second output data signals, which are based on the first and second input data signal, through the first and second test lines, respectively, and the error detection driver is configured to detect a fault of the first or second driving circuit based on the first or second output data signal.