17653390. SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)

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SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

Organization Name

Samsung Electronics Co., Ltd.

Inventor(s)

Tea Won Kim of Hwaseong-si (KR)

Hyung Joon Kim of Yongin-si (KR)

Yong-Suk Tak of Seoul (KR)

Yu Rim Kim of Hwaseong-si (KR)

Kong Soo Lee of Hwaseong-si (KR)

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME - A simplified explanation of the abstract

This abstract first appeared for US patent application 17653390 titled 'SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

Simplified Explanation

The patent application describes a semiconductor device that includes a conductive line, oxide semiconductor layers, a gate electrode, and a capacitor structure.

  • The device has a conductive line on a substrate.
  • There is a first oxide semiconductor layer on the conductive line, made of a crystalline oxide semiconductor material containing a metal element.
  • A second oxide semiconductor layer is in physical contact with the first oxide semiconductor layer and connected to the conductive line.
  • A gate electrode extends in a direction perpendicular to the conductive line, on the side of the second oxide semiconductor layer.
  • A capacitor structure is connected to the second oxide semiconductor layer and the gate electrode.
  • The second oxide semiconductor layer contains a crystalline oxide semiconductor material with the same metal element as the first oxide semiconductor layer, as well as two different metal elements.

Potential applications of this technology:

  • Integrated circuits
  • Transistors
  • Memory devices
  • Display panels

Problems solved by this technology:

  • Improved performance and functionality of semiconductor devices
  • Enhanced conductivity and stability of oxide semiconductor layers
  • Efficient integration of different metal elements in the oxide semiconductor layers

Benefits of this technology:

  • Higher efficiency and reliability of semiconductor devices
  • Increased speed and performance of integrated circuits
  • Improved memory storage and data processing capabilities
  • Enhanced display quality and resolution


Original Abstract Submitted

A semiconductor device includes a conductive line that extends in a first direction on a substrate, a first oxide semiconductor layer, including a first crystalline oxide semiconductor material containing a first metal element, on the conductive line, a second oxide semiconductor layer, which is in physical contact with the first oxide semiconductor layer and is connected to the conductive line, on the conductive line, a gate electrode that extends in a second direction, which crosses the first direction, on a side of the second oxide semiconductor layer, and a capacitor structure connected to the second oxide semiconductor layer on the second oxide semiconductor layer and the gate electrode, wherein the second oxide semiconductor layer includes a second crystalline oxide semiconductor material containing the first metal element and second and third metal elements, which are different from the first metal element.