17587805. METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND A SEMICONDUCTOR DEVICE simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)

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METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND A SEMICONDUCTOR DEVICE

Organization Name

TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

Inventor(s)

Han-Yu Tsai of Hsinchu City (TW)

Yi-Hsiu Liu of Taipei (TW)

You-Ting Lin of Miaoli County (TW)

Chih-Chung Chang of Mingjian Township (TW)

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND A SEMICONDUCTOR DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 17587805 titled 'METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND A SEMICONDUCTOR DEVICE

Simplified Explanation

The patent application describes a method of manufacturing a semiconductor device. Here are the key points:

  • The method involves forming a fin structure, which includes layers of different semiconductors, over a bottom fin structure and a hard mask layer.
  • An isolation insulating layer is then formed, exposing the hard mask layer and the stacked layer.
  • A sacrificial cladding layer is formed over the exposed hard mask layer and stacked layer.
  • Layers of a first dielectric layer and an insertion layer are formed over the sacrificial cladding layer and the fin structure.
  • An annealing operation is performed to convert a portion of the first dielectric layer and the insertion layer from an amorphous form to a crystalline form.
  • The remaining amorphous portion of the first dielectric layer and the insertion layer is removed, resulting in the formation of a recess.

Potential applications of this technology:

  • Manufacturing of advanced semiconductor devices, such as transistors and integrated circuits.

Problems solved by this technology:

  • The method allows for the precise formation of a recess in the semiconductor device, which can be useful for various device structures and functionalities.
  • It provides a way to convert amorphous layers to crystalline form, which can enhance the performance and reliability of the semiconductor device.

Benefits of this technology:

  • Improved control and precision in the manufacturing process of semiconductor devices.
  • Enhanced performance and reliability of the devices.
  • Potential for the development of more advanced and efficient electronic devices.


Original Abstract Submitted

A method of manufacturing a semiconductor device includes forming a fin structure including a stacked layer of first semiconductor layers and second semiconductor layers disposed over a bottom fin structure and a hard mask layer over the stacked layer, forming an isolation insulating layer so that the hard mask layer and the stacked layer are exposed from the isolation insulating layer, forming a sacrificial cladding layer over at least sidewalls of the exposed hard mask layer and stacked layer, forming layers of a first dielectric layer and an insertion layer over the sacrificial cladding layer and the fin structure, performing an annealing operation to convert a portion of the layers of the first dielectric layer and the insertion layer from an amorphous form to a crystalline form, and removing the remaining amorphous portion of the layers of the first dielectric layer and the insertion layer to form a recess.