17540835. LOCALIZED MAGNETIC FIELD TESTING simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)

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LOCALIZED MAGNETIC FIELD TESTING

Organization Name

INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor(s)

Kushagra Sinha of Wappingers Falls NY (US)

Pablo Nieves of Pinebluff NY (US)

Reinaldo Vega of Mahopac NY (US)

LOCALIZED MAGNETIC FIELD TESTING - A simplified explanation of the abstract

This abstract first appeared for US patent application 17540835 titled 'LOCALIZED MAGNETIC FIELD TESTING

Simplified Explanation

Abstract

A testing apparatus has been developed that includes two electromagnets. These electromagnets are capable of exposing test devices to electromagnetic fields.

Patent/Innovation Explanation

  • The testing apparatus consists of two electromagnets.
  • The first electromagnet is used to expose a first test device to a specific electromagnetic field.
  • The second electromagnet is used to expose a second test device to a different electromagnetic field.

Potential Applications

  • Testing the effects of different electromagnetic fields on various devices.
  • Researching the impact of electromagnetic fields on different materials.
  • Developing and optimizing electromagnetic shielding for electronic devices.

Problems Solved

  • Provides a controlled environment for testing the effects of electromagnetic fields on devices.
  • Allows for precise exposure to specific electromagnetic fields.
  • Enables researchers to study the impact of electromagnetic fields on different devices and materials.

Benefits

  • Allows for accurate and repeatable testing of devices in electromagnetic fields.
  • Provides insights into the behavior and performance of devices under different electromagnetic conditions.
  • Facilitates the development of improved electromagnetic shielding for electronic devices.


Original Abstract Submitted

A testing apparatus comprises a first electromagnet. The first electromagnet can be configured to expose a first test device to a first electromagnetic field. The testing apparatus also comprises a second electromagnet. The second electromagnet can be configured to expose a second test device to a second electromagnetic field.

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