17461304. SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)

From WikiPatents
Revision as of 04:53, 2 January 2024 by Wikipatents (talk | contribs) (Creating a new page)
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)
Jump to navigation Jump to search

SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME

Organization Name

TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

Inventor(s)

Hsin-Yi Lee of Hsinchu City (TW)

Cheng-Lung Hung of Hsinchu City (TW)

Chi On Chui of Hsinchu City (TW)

SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME - A simplified explanation of the abstract

This abstract first appeared for US patent application 17461304 titled 'SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME

Simplified Explanation

Abstract

A semiconductor device has been developed that includes source and drain regions, a channel region, and a gate structure. The gate structure consists of a gate dielectric, a work function metal layer containing iodine, and a fill metal.

Patent/Innovation Explanation

  • The semiconductor device includes source and drain regions, a channel region, and a gate structure.
  • The gate structure consists of a gate dielectric, a work function metal layer, and a fill metal.
  • The work function metal layer contains iodine.

Potential Applications

  • This technology can be used in the manufacturing of various semiconductor devices.
  • It can be applied in the production of transistors, integrated circuits, and other electronic components.

Problems Solved

  • The use of a work function metal layer containing iodine helps improve the performance and efficiency of the semiconductor device.
  • It addresses the challenge of achieving optimal conductivity and control over the flow of electrical current.

Benefits

  • The inclusion of a gate dielectric, work function metal layer, and fill metal enhances the functionality and reliability of the semiconductor device.
  • The use of iodine in the work function metal layer provides improved electrical properties.
  • This technology enables the production of more efficient and high-performance electronic devices.


Original Abstract Submitted

A semiconductor device includes source and drain regions, a channel region between the source and drain regions, and a gate structure over the channel region. The gate structure includes a gate dielectric over the channel region, a work function metal layer over the gate dielectric and comprising iodine, and a fill metal over the work function metal layer.