View source for 17043960. DISTRIBUTED COMPUTING SYSTEM FOR PRODUCT DEFECT ANALYSIS simplified abstract (BOE TECHNOLOGY GROUP CO., LTD.)

=DISTRIBUTED COMPUTING SYSTEM FOR PRODUCT DEFECT ANALYSIS=


==Organization Name==

[[:Category:BOE TECHNOLOGY GROUP CO., LTD.|BOE TECHNOLOGY GROUP CO., LTD.]]


[[Category:BOE TECHNOLOGY GROUP CO., LTD.]]

==Inventor(s)==

[[:Category:Zhaoyue Li of Beijing (CN)|Zhaoyue Li of Beijing (CN)]][[Category:Zhaoyue Li of Beijing (CN)]]

[[:Category:Dong Chai of Beijing (CN)|Dong Chai of Beijing (CN)]][[Category:Dong Chai of Beijing (CN)]]

[[:Category:Yaoping Wang of Beijing (CN)|Yaoping Wang of Beijing (CN)]][[Category:Yaoping Wang of Beijing (CN)]]

[[:Category:Meijuan Zhang of Beijing (CN)|Meijuan Zhang of Beijing (CN)]][[Category:Meijuan Zhang of Beijing (CN)]]

[[:Category:Hong Wang of Beijing (CN)|Hong Wang of Beijing (CN)]][[Category:Hong Wang of Beijing (CN)]]

==DISTRIBUTED COMPUTING SYSTEM FOR PRODUCT DEFECT ANALYSIS - A simplified explanation of the abstract==


This abstract first appeared for US patent application 17043960 titled 'DISTRIBUTED COMPUTING SYSTEM FOR PRODUCT DEFECT ANALYSIS

==Simplified Explanation==

The abstract of the patent application describes a distributed computing system designed for analyzing product defects. The system consists of multiple computing clusters, a product image database, and a client device.

* The system includes a computing cluster responsible for processing product manufacturing messages.
* Another computing cluster is dedicated to identifying product defects.
* A product image database is used to store images of the products.
* A client device is used to access and interact with the system.

== Potential Applications ==
This technology can be applied in various industries and scenarios, including:

* Manufacturing: The system can be used to analyze product defects in manufacturing processes, helping to improve quality control.
* Retail: It can be utilized to identify and analyze defects in products before they are sold to customers, ensuring higher customer satisfaction.
* Automotive: The system can be employed to detect and analyze defects in automotive parts or vehicles during the manufacturing process, enhancing safety and reliability.

== Problems Solved ==
The distributed computing system for product defect analysis addresses the following problems:

* Manual analysis: It eliminates the need for manual inspection and analysis of product defects, saving time and reducing human error.
* Scalability: The system can handle large volumes of product manufacturing messages and efficiently process them in a distributed manner.
* Data management: The product image database allows for easy storage and retrieval of product images, facilitating defect identification and analysis.

== Benefits ==
The use of this technology offers several benefits:

* Improved efficiency: By automating the analysis of product defects, the system speeds up the process and allows for real-time identification.
* Enhanced accuracy: The system reduces the chances of human error in defect identification and analysis.
* Cost savings: By automating the process and reducing the need for manual inspection, the system helps save costs associated with quality control.


==Original Abstract Submitted==

A distributed computing system for product defect analysis is disclosed. The distributed computing system for product defect analysis includes a computing cluster for processing product manufacturing messages, a computing cluster for identifying product defect, a product image database, and a client device.



[[Category:G06T7/00]]
[[Category:G05B19/418]]