17043960. DISTRIBUTED COMPUTING SYSTEM FOR PRODUCT DEFECT ANALYSIS simplified abstract (BOE TECHNOLOGY GROUP CO., LTD.)
DISTRIBUTED COMPUTING SYSTEM FOR PRODUCT DEFECT ANALYSIS
Organization Name
BOE TECHNOLOGY GROUP CO., LTD.
Inventor(s)
DISTRIBUTED COMPUTING SYSTEM FOR PRODUCT DEFECT ANALYSIS - A simplified explanation of the abstract
This abstract first appeared for US patent application 17043960 titled 'DISTRIBUTED COMPUTING SYSTEM FOR PRODUCT DEFECT ANALYSIS
Simplified Explanation
The abstract of the patent application describes a distributed computing system designed for analyzing product defects. The system consists of multiple computing clusters, a product image database, and a client device.
- The system includes a computing cluster responsible for processing product manufacturing messages.
- Another computing cluster is dedicated to identifying product defects.
- A product image database is used to store images of the products.
- A client device is used to access and interact with the system.
Potential Applications
This technology can be applied in various industries and scenarios, including:
- Manufacturing: The system can be used to analyze product defects in manufacturing processes, helping to improve quality control.
- Retail: It can be utilized to identify and analyze defects in products before they are sold to customers, ensuring higher customer satisfaction.
- Automotive: The system can be employed to detect and analyze defects in automotive parts or vehicles during the manufacturing process, enhancing safety and reliability.
Problems Solved
The distributed computing system for product defect analysis addresses the following problems:
- Manual analysis: It eliminates the need for manual inspection and analysis of product defects, saving time and reducing human error.
- Scalability: The system can handle large volumes of product manufacturing messages and efficiently process them in a distributed manner.
- Data management: The product image database allows for easy storage and retrieval of product images, facilitating defect identification and analysis.
Benefits
The use of this technology offers several benefits:
- Improved efficiency: By automating the analysis of product defects, the system speeds up the process and allows for real-time identification.
- Enhanced accuracy: The system reduces the chances of human error in defect identification and analysis.
- Cost savings: By automating the process and reducing the need for manual inspection, the system helps save costs associated with quality control.
Original Abstract Submitted
A distributed computing system for product defect analysis is disclosed. The distributed computing system for product defect analysis includes a computing cluster for processing product manufacturing messages, a computing cluster for identifying product defect, a product image database, and a client device.
