US Patent Application 18362760. SEMICONDUCTOR PROCESS CHAMBER CONTAMINATION PREVENTION SYSTEM simplified abstract

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SEMICONDUCTOR PROCESS CHAMBER CONTAMINATION PREVENTION SYSTEM

Organization Name

TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

Inventor(s)

Kai-Chin Wei of Hsinchu (TW)

Che-fu Chen of Hsinchu (TW)

SEMICONDUCTOR PROCESS CHAMBER CONTAMINATION PREVENTION SYSTEM - A simplified explanation of the abstract

This abstract first appeared for US patent application 18362760 titled 'SEMICONDUCTOR PROCESS CHAMBER CONTAMINATION PREVENTION SYSTEM

Simplified Explanation

The patent application describes a semiconductor process system that includes a chamber for semiconductor processing and a pump to extract gases from the chamber.

  • The system includes fluid nozzles that prevent particles from flowing back into the chamber when the pump stops working.
  • The fluid nozzles create a barrier of fluid within the outlet channel to block the flow of particles.
  • This innovation helps maintain the cleanliness of the semiconductor process chamber and prevents contamination during the pumping process.


Original Abstract Submitted

A semiconductor process system includes a semiconductor process chamber having an interior volume. A pump extracts gases from the semiconductor process chamber via an outlet channel communicably coupled to the semiconductor process chamber. The system includes a plurality of fluid nozzles configured to prevent the backflow of particles from the outlet channel to interior volume by generating a fluid barrier within the outlet channel responsive to the pump ceasing to function.