View source for US Patent Application 18026026. MEASUREMENT DEVICE, INFORMATION PROCESSING DEVICE, POSITION ADJUSTMENT METHOD, AND COMPUTER-READABLE MEDIUM simplified abstract

=MEASUREMENT DEVICE, INFORMATION PROCESSING DEVICE, POSITION ADJUSTMENT METHOD, AND COMPUTER-READABLE MEDIUM=


==Organization Name==

[[NEC Corporation]]


==Inventor(s)==

[[Jiro Abe of Tokyo (JP)]]

==MEASUREMENT DEVICE, INFORMATION PROCESSING DEVICE, POSITION ADJUSTMENT METHOD, AND COMPUTER-READABLE MEDIUM - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18026026 titled 'MEASUREMENT DEVICE, INFORMATION PROCESSING DEVICE, POSITION ADJUSTMENT METHOD, AND COMPUTER-READABLE MEDIUM

==Simplified Explanation==

- The patent application describes a measurement device that acquires point cloud data at different measurement positions.
- The device determines a rotation axis to adjust the position of the acquired data.
- Based on the rotation axis, the first and second point cloud data, an evaluation function is determined to represent the desirability of the positional adjustment result.
- The device calculates a positional adjustment parameter that optimizes the evaluation function.
- The innovation aims to improve the accuracy and efficiency of positional adjustment in measurement devices.


==Original Abstract Submitted==

A measurement device acquires first point cloud data at a first measurement position and second point cloud data at a second measurement position; determines a rotation axis for positional adjustment; determines, based on the rotation axis, the first point cloud data, and the second point cloud data, an evaluation function indicating a region that is a union set of one or more columnar bodies as an evaluation function representing desirability of a positional adjustment result; and calculates a positional adjustment parameter that optimizes the evaluation function based on the rotation axis, the first point cloud data, and the second point cloud data.