View source for US Patent Application 17827204. SYSTEMS AND METHODS FOR OPTIMIZING FULL HORIZONTAL SCANNED BEAM DISTANCE simplified abstract

=SYSTEMS AND METHODS FOR OPTIMIZING FULL HORIZONTAL SCANNED BEAM DISTANCE=


==Organization Name==

[[:Category:Applied Materials, Inc.|Applied Materials, Inc.]]


[[Category:Applied Materials, Inc.]]

==Inventor(s)==

[[:Category:Tyler Wills of Marblehead MA (US)|Tyler Wills of Marblehead MA (US)]][[Category:Tyler Wills of Marblehead MA (US)]]

[[:Category:George M. Gammel of Marblehead MA (US)|George M. Gammel of Marblehead MA (US)]][[Category:George M. Gammel of Marblehead MA (US)]]

[[:Category:Eric Donald Wilson of Rockport MA (US)|Eric Donald Wilson of Rockport MA (US)]][[Category:Eric Donald Wilson of Rockport MA (US)]]

[[:Category:Jay T. Scheuer of Rowley MA (US)|Jay T. Scheuer of Rowley MA (US)]][[Category:Jay T. Scheuer of Rowley MA (US)]]

[[:Category:Xiangdong He of Westborough MA (US)|Xiangdong He of Westborough MA (US)]][[Category:Xiangdong He of Westborough MA (US)]]

[[:Category:Shardul Patel of North Reading MA (US)|Shardul Patel of North Reading MA (US)]][[Category:Shardul Patel of North Reading MA (US)]]

[[:Category:Robert C. Lindberg of Rockport MA (US)|Robert C. Lindberg of Rockport MA (US)]][[Category:Robert C. Lindberg of Rockport MA (US)]]

==SYSTEMS AND METHODS FOR OPTIMIZING FULL HORIZONTAL SCANNED BEAM DISTANCE - A simplified explanation of the abstract==


This abstract first appeared for US patent application 17827204 titled 'SYSTEMS AND METHODS FOR OPTIMIZING FULL HORIZONTAL SCANNED BEAM DISTANCE

==Simplified Explanation==

- The patent application describes methods for optimizing the distance that an accelerator beam can be scanned horizontally.
- The approach involves positioning two Faraday cups on opposite sides of the intended beam-scan area.
- An ion beam is then scanned along the first and second sides of the intended beam-scan area.
- The first and second Faraday cups measure the beam current of the ion beam at their respective positions.
- Based on the measurements from the Faraday cups, an optimal scan distance for the ion beam across the intended beam-scan area is determined.
- The invention aims to improve the efficiency and accuracy of accelerator beam scanning.


==Original Abstract Submitted==

Provided herein are approaches for optimizing a full horizontal scanned beam distance of an accelerator beam. In one approach, a method may include positioning a first Faraday cup along a first side of an intended beam-scan area, positioning a second Faraday cup along a second side of the intended beam-scan area, scanning an ion beam along the first and second sides of the intended beam-scan area, measuring a first beam current of the ion beam at the first Faraday cup and measuring a second beam current of the ion beam at the second Faraday cup, and determining an optimal scan distance of the ion beam across the intended beam-scan area based on the first beam current and the second beam current.



[[Category:H01J37/304]]
[[Category:H01J37/317]]