View source for 18094100. METHOD FOR DETERMINING PERFORMANCE OF SEQUENTIAL LOGIC ELEMENTS AND DEVICE simplified abstract (Changxin Memory Technologies, Inc.)

=METHOD FOR DETERMINING PERFORMANCE OF SEQUENTIAL LOGIC ELEMENTS AND DEVICE=


==Organization Name==

[[:Category:Changxin Memory Technologies, Inc.|Changxin Memory Technologies, Inc.]]


[[Category:Changxin Memory Technologies, Inc.]]

==Inventor(s)==

[[:Category:Zengquan Wu of HEFEI (CN)|Zengquan Wu of HEFEI (CN)]][[Category:Zengquan Wu of HEFEI (CN)]]

==METHOD FOR DETERMINING PERFORMANCE OF SEQUENTIAL LOGIC ELEMENTS AND DEVICE - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18094100 titled 'METHOD FOR DETERMINING PERFORMANCE OF SEQUENTIAL LOGIC ELEMENTS AND DEVICE

==Simplified Explanation==

The abstract describes a method for determining the performance of sequential logic elements in a circuit. Here is a simplified explanation of the abstract:

* The method involves obtaining a performance check file for each sequential logic element in the circuit.
* The circuit is then simulated separately using multiple simulation waveforms, based on the performance check file for each logic element.
* During the simulation process, the performance check file is used to determine if the target characteristic parameter of each logic element meets a preset condition.
* If a logic element's characteristic parameter does not meet the preset condition, the simulation result will output identification information for that specific logic element.

Potential applications of this technology:

* Circuit design and optimization: The method can be used to analyze and improve the performance of sequential logic elements in circuit designs.
* Quality control: It can be used to identify and rectify any performance issues in sequential logic elements during the manufacturing process.

Problems solved by this technology:

* Identifying performance issues: The method allows for the detection of sequential logic elements that do not meet the preset condition, helping to identify potential problems in circuit designs.
* Efficient analysis: By separately simulating each logic element, the method allows for a more detailed and accurate analysis of their performance.

Benefits of this technology:

* Improved circuit performance: By identifying and rectifying performance issues in sequential logic elements, the overall performance of the circuit can be enhanced.
* Time and cost savings: The method allows for efficient analysis and identification of performance issues, reducing the time and cost required for circuit design and manufacturing.


==Original Abstract Submitted==

A method for determining performance of sequential logic elements includes the following operations. To check a circuit, a performance check file corresponding to each of the sequential logic elements of the circuit is obtained; and the circuit is separately simulated to obtain the simulation result, by using a plurality of simulation waveforms, based on the performance check file corresponding to each of the sequential logic elements. The performance check file may be used to determine, in a simulation process, whether a target characteristic parameter of each of the sequential logic elements meets a preset condition, and identification information of a target sequential logic element having a target characteristic parameter that does not meet the preset condition is output in the simulation result.



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