View source for 17858731. ADAPTIVE WEAR LEVELING FOR ENDURANCE COMPENSATION simplified abstract (Micron Technology, Inc.)

=ADAPTIVE WEAR LEVELING FOR ENDURANCE COMPENSATION=


==Organization Name==

[[:Category:Micron Technology, Inc.|Micron Technology, Inc.]]


[[Category:Micron Technology, Inc.]]

==Inventor(s)==

[[:Category:Charles See Yeung Kwong of Redwood City CA (US)|Charles See Yeung Kwong of Redwood City CA (US)]][[Category:Charles See Yeung Kwong of Redwood City CA (US)]]

[[:Category:Seungjune Jeon of Santa Clara CA (US)|Seungjune Jeon of Santa Clara CA (US)]][[Category:Seungjune Jeon of Santa Clara CA (US)]]

[[:Category:Wei Wang of Dublin CA (US)|Wei Wang of Dublin CA (US)]][[Category:Wei Wang of Dublin CA (US)]]

[[:Category:Zhenming Zhou of San Jose CA (US)|Zhenming Zhou of San Jose CA (US)]][[Category:Zhenming Zhou of San Jose CA (US)]]

==ADAPTIVE WEAR LEVELING FOR ENDURANCE COMPENSATION - A simplified explanation of the abstract==


This abstract first appeared for US patent application 17858731 titled 'ADAPTIVE WEAR LEVELING FOR ENDURANCE COMPENSATION

==Simplified Explanation==

The abstract describes a method for managing the reliability of memory devices by identifying blocks within the memory and associating them with a capability metric that reflects the projected reliability of the underlying components. If the capability metric meets a certain condition, a cycle threshold is determined for the block. When the program/erase cycle counter reaches the cycle threshold, the block is excluded from the set of blocks and a program operation is performed on the updated set.

* Identifying blocks of a memory device and associating them with a capability metric reflecting the projected reliability of the underlying components.
* Determining a cycle threshold for a block based on the capability metric.
* Updating the set of blocks by excluding a block when the program/erase cycle counter matches the cycle threshold.
* Performing a program operation on the updated set of blocks.

== Potential Applications ==
* Memory management in electronic devices.
* Improving the reliability and lifespan of memory devices.

== Problems Solved ==
* Ensuring the reliability of memory devices by monitoring and managing the program/erase cycles.
* Optimizing the use of memory blocks based on their projected reliability.

== Benefits ==
* Increased reliability and lifespan of memory devices.
* Efficient utilization of memory blocks.
* Improved performance and longevity of electronic devices.


==Original Abstract Submitted==

A set of blocks of a memory device comprising a plurality of dies is identified. A block within the set of blocks is identified. The identified block is associated with a capability metric that reflects a projected reliability of the die on which the block resides. Responsive to determining that the capability metric satisfies a condition, a cycle threshold associated with the die is identified. Responsive to determining that a cycle count value derived from a program/erase cycle counter associated with the die matches the cycle threshold, the set of blocks is updated by excluding the block from the set of blocks. A program operation is performed with respect to the updated set of blocks.



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