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Category:G01R31/3183
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Pages in category "G01R31/3183"
The following 15 pages are in this category, out of 15 total.
1
- 17838298. SIMULATION METHOD AND SYSTEM OF VERIFYING OPERATION OF SEMICONDUCTOR MEMORY DEVICE OF MEMORY MODULE AT DESIGN LEVEL simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18174647. TEST MODE CONTROL CIRCUIT, SEMICONDUCTOR APPARATUS AND SYSTEM, AND METHOD THEREOF simplified abstract (SK hynix Inc.)
- 18229965. LOW POWER ENVIRONMENT FOR HIGH PERFORMANCE PROCESSOR WITHOUT LOW POWER MODE simplified abstract (ADVANTEST CORPORATION)
- 18368195. 3D TAP & SCAN PORT ARCHITECTURES simplified abstract (Texas Instruments Incorporated)
- 18506435. METHOD, DEVICE, AND SYSTEM FOR DETECTING FUSE CONFIGURATION FOR TRIMMING CIRCUIT simplified abstract (Samsung Electronics Co., Ltd.)
- 18512792. SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
H
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- Samsung electronics co., ltd. (20240159827). METHOD, DEVICE, AND SYSTEM FOR DETECTING FUSE CONFIGURATION FOR TRIMMING CIRCUIT simplified abstract
- Samsung Electronics Co., Ltd. patent applications on May 16th, 2024
- Sk hynix inc. (20240159828). TEST MODE CONTROL CIRCUIT, SEMICONDUCTOR APPARATUS AND SYSTEM, AND METHOD THEREOF simplified abstract
- SK hynix Inc. patent applications on May 16th, 2024