SEARCH RESULTS for assignor:"CHOI, YUN-HYEOK"

Showing 1 to 1 of 1 results

Last Update Patent(s) Assignor(s) Orig. Assignee(s) Assignee(s) Reel/Frame
17-May-2018

(X0) 1: RANDOMNESS TEST APPARATUS AND METHOD FOR RANDOM NUMBER GENERATOR

(A1) 2: RANDOMNESS TEST APPARATUS AND METHOD FOR RANDOM NUMBER GENERATOR

BOHDAN, KARPINSKYY

LEE, YONG-KI

NOH, MI-JUNG

PARK, SANG-WOOK

KIM, KITAK

KIM, YONG-SOO

CHOI, YUN-HYEOK

SAMSUNG ELECTRONICS CO., LTD.

40976/168