SEARCH RESULTS for assignee:"ASML NETHERLANDS B.V." AND day:[2018-12-01T00:00:00Z TO 2018-12-31T23:59:59Z]

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(X0) 15996992: COMPUTATIONAL WAFER INSPECTION

(A1) 20180365369: COMPUTATIONAL WAFER INSPECTION

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(X0) 15781813: SUBSTRATE TABLE, LITHOGRAPHIC APPARATUS AND METHOD OF OPERATING A LITHOGRAPHIC APPARATUS

(A1) 20180364584: SUBSTRATE TABLE, LITHOGRAPHIC APPARATUS AND METHOD OF OPERATING A LITHOGRAPHIC APPARATUS

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(X0) 16061016: IMPROVEMENTS IN GAUGE PATTERN SELECTION

(A1) 20180364589: IMPROVEMENTS IN GAUGE PATTERN SELECTION

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(X0) 16061847: DROPLET GENERATOR FOR LITHOGRAPHIC APPARATUS, EUV SOURCE AND LITHOGRAPHIC APPARATUS

(A1) 20180364580: DROPLET GENERATOR FOR LITHOGRAPHIC APPARATUS, EUV SOURCE AND LITHOGRAPHIC APPARATUS

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(X0) 16111313: METHOD FOR PREVENTING OR REDUCING CONTAMINATION OF AN IMMERSION TYPE PROJECTION APPARATUS AND AN IMMERSION TYPE LITHOGRAPHIC APPARATUS

(A1) 20180364585: METHOD FOR PREVENTING OR REDUCING CONTAMINATION OF AN IMMERSION TYPE PROJECTION APPARATUS AND AN IMMERSION TYPE LITHOGRAPHIC APPARATUS

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(X0) 15781885: DROPLET GENERATOR FOR LITHOGRAPHIC APPARATUS, EUV SOURCE AND LITHOGRAPHIC APPARATUS

(A1) 20180368241: DROPLET GENERATOR FOR LITHOGRAPHIC APPARATUS, EUV SOURCE AND LITHOGRAPHIC APPARATUS

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(X0) 15994400: APPARATUS OPERABLE TO PERFORM A MEASUREMENT OPERATION ON A SUBSTRATE, LITHOGRAPHIC APPARATUS, AND METHOD OF PERFORMING A MEASUREMENT OPERATION ON A SUBSTRATE

(A1) 20180364582: APPARATUS OPERABLE TO PERFORM A MEASUREMENT OPERATION ON A SUBSTRATE, LITHOGRAPHIC APPARATUS, AND METHOD OF PERFORMING A MEASUREMENT OPERATION ON A SUBSTRATE

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(A1) 20180365369: COMPUTATIONAL WAFER INSPECTION

(X0) 15996992: COMPUTATIONAL WAFER INSPECTION

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(X0) 15996992: COMPUTATIONAL WAFER INSPECTION

(A1) 20180365369: COMPUTATIONAL WAFER INSPECTION

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(X0) 15996992: COMPUTATIONAL WAFER INSPECTION

(A1) 20180365369: COMPUTATIONAL WAFER INSPECTION

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(X0) 16060195: OPTICAL SYSTEM AND METHOD

(A1) 20180364587: OPTICAL SYSTEM AND METHOD

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(X0) 16060192: METROLOGY BY RECONSTRUCTION

(A1) 20180364588: METROLOGY BY RECONSTRUCTION

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(X0) 15962307: SUPPLY SYSTEM FOR AN EXTREME ULTRAVIOLET LIGHT SOURCE

(A1) 20180368242: SUPPLY SYSTEM FOR AN EXTREME ULTRAVIOLET LIGHT SOURCE

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(X0) 16061847: DROPLET GENERATOR FOR LITHOGRAPHIC APPARATUS, EUV SOURCE AND LITHOGRAPHIC APPARATUS

(A1) 20180364580: DROPLET GENERATOR FOR LITHOGRAPHIC APPARATUS, EUV SOURCE AND LITHOGRAPHIC APPARATUS

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(X0) 13306668: MEASURING METHOD, APPARATUS AND SUBSTRATE

(A1) 20120133938: MEASURING METHOD, APPARATUS AND SUBSTRATE

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(B2) 10151987: MEASURING METHOD, APPARATUS AND SUBSTRATE

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