Information for "Taiwan semiconductor manufacturing company, ltd. (20240381793). OXYGEN AFFINITY LAYER TO IMPROVE RRAM CELL PERFORMANCE simplified abstract"
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Display title | Taiwan semiconductor manufacturing company, ltd. (20240381793). OXYGEN AFFINITY LAYER TO IMPROVE RRAM CELL PERFORMANCE simplified abstract |
Default sort key | Taiwan semiconductor manufacturing company, ltd. (20240381793). OXYGEN AFFINITY LAYER TO IMPROVE RRAM CELL PERFORMANCE simplified abstract |
Page length (in bytes) | 3,959 |
Page ID | 238034 |
Page content language | en - English |
Page content model | wikitext |
Indexing by robots | Allowed |
Number of redirects to this page | 0 |
Counted as a content page | Yes |
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Edit history
Page creator | Wikipatents (talk | contribs) |
Date of page creation | 01:56, 25 November 2024 |
Latest editor | Wikipatents (talk | contribs) |
Date of latest edit | 01:56, 25 November 2024 |
Total number of edits | 1 |
Recent number of edits (within past 90 days) | 1 |
Recent number of distinct authors | 1 |