18554666. DEVICE INSPECTION APPARATUS AND DEVICE INSPECTION METHOD simplified abstract (Tokyo Electron Limited)
Contents
DEVICE INSPECTION APPARATUS AND DEVICE INSPECTION METHOD
Organization Name
Inventor(s)
Shinya Kurebayashi of Yamanashi (JP)
DEVICE INSPECTION APPARATUS AND DEVICE INSPECTION METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 18554666 titled 'DEVICE INSPECTION APPARATUS AND DEVICE INSPECTION METHOD
The patent application describes a device inspection apparatus that applies a voltage to a device to be inspected and detects potential differences across different resistor groups.
- Voltage source applies voltage to device
- Plurality of resistors connected in series
- Detector detects potential difference across resistor groups
- Switching device switches resistor groups
- Controller controls detector and switching device
- Potential differences detected in ascending order of combined resistance value
- Potential Applications:**
- Electronic device testing - Quality control in manufacturing processes - Circuit board inspection
- Problems Solved:**
- Efficient and accurate device inspection - Identifying faulty components in electronic devices
- Benefits:**
- Streamlined inspection process - Improved accuracy in detecting faults - Cost-effective solution for quality control
- Commercial Applications:**
Title: "Advanced Device Inspection Apparatus for Electronics Manufacturing" This technology can be utilized in electronics manufacturing facilities to ensure the quality and reliability of electronic devices before they are released to the market. It can also be integrated into automated testing systems for increased efficiency in production processes.
- Prior Art:**
Prior art related to this technology may include patents or research papers on device inspection methods using resistors and voltage sources in electronic testing.
- Frequently Updated Research:**
Research on advancements in device inspection technology, such as new methods for detecting faults in electronic components and improving the accuracy of inspection processes, would be relevant to this technology.
- Questions about Device Inspection Apparatus:**
1. How does the apparatus determine the order in which potential differences across resistor groups are detected? 2. What are the key advantages of using a voltage source and resistors in device inspection?
Original Abstract Submitted
A device inspection apparatus according to one aspect of the present disclosure includes a voltage source configured to apply a voltage to a device to be inspected, a plurality of resistors connected in series between the voltage source and the device, a detector configured to detect a potential difference across both ends of a resistor group that includes one or more resistors among the plurality of resistors, a switching device configured to switch the resistor group from which the detector detects the potential difference among the plurality of resistors, and a controller, wherein the controller is configured to control the detector and the switching device, so as to detect a potential difference across both ends of at least two or more different resistor groups, and is configured to control the detector and the switching device to detect the potential difference in an ascending order of a combined resistance value between both ends of the at least two or more resistor groups.
