18478038. FORCE/MEASURE CURRENT GAIN TRIMMING simplified abstract (Texas Instruments Incorporated)
Contents
FORCE/MEASURE CURRENT GAIN TRIMMING
Organization Name
Texas Instruments Incorporated
Inventor(s)
Tanmay Neema of Bangalore (IN)
Rajavelu Thinakaran of Bangalore (IN)
Gautam Nandi of Bangalore (IN)
FORCE/MEASURE CURRENT GAIN TRIMMING - A simplified explanation of the abstract
This abstract first appeared for US patent application 18478038 titled 'FORCE/MEASURE CURRENT GAIN TRIMMING
The techniques and circuits described in this patent application focus on error compensation in source measurement units (SMUs). An SMU is a device capable of both sourcing current to a device under test (DUT) and measuring current through the DUT.
- An SMU may include a sensing resistor coupled in series with the DUT.
- A current sensing amplifier can measure the voltage across the sensing resistor to determine the output current through the DUT.
- The resistance of the sensing resistor may vary due to manufacturing tolerances, which can impact accuracy.
- The gain of the current sensing amplifier can be calibrated to compensate for sensing resistor variance, improving the accuracy of current sourcing and measurement to the DUT.
Potential Applications: - Electronic testing and measurement equipment - Semiconductor device characterization - Circuit design and development
Problems Solved: - Error compensation in source measurement units - Improving accuracy in current sourcing and measurement
Benefits: - Increased accuracy in current measurement - Enhanced performance of source measurement units - Improved reliability in electronic testing processes
Commercial Applications: Title: "Enhancing Accuracy in Electronic Testing with Error Compensation Technology" This technology can be utilized in industries such as semiconductor manufacturing, electronic component testing, and research laboratories to improve the accuracy and reliability of current measurements.
Questions about Error Compensation in Source Measurement Units: 1. How does error compensation technology impact the overall efficiency of electronic testing processes?
- Error compensation technology can significantly improve the accuracy and reliability of current measurements, leading to more precise testing results and increased efficiency in electronic testing processes.
2. What are the potential challenges in implementing error compensation techniques in source measurement units?
- Implementing error compensation techniques may require calibration processes and adjustments to account for sensing resistor variance, which can add complexity to the setup and calibration of SMUs.
Original Abstract Submitted
The techniques and circuits, described herein, include solutions for error compensation in source measurement units (SMUs). An example SMU is capable of both sourcing current to a device under test (DUT) and measuring current through the DUT. An SMU may include a sensing resistor coupled in series with the DUT. A voltage across the sensing resistor may be measured by a current sensing amplifier in order to determine the output current through the DUT. In practice, the resistance of the sensing resistor may vary depending on manufacturing tolerances, etc. A gain of the current sensing amplifier may be calibrated in order to compensate for sensing resistor variance, which increases the accuracy with which current to the DUT can be sourced and measured.
