18180101. TESTING APPARATUS simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)

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TESTING APPARATUS

Organization Name

Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor(s)

Chih-Chieh Liao of Hsinchu City (TW)

Yu-Min Sun of Hsinchu City (TW)

Chih-Feng Cheng of Hsinchu City (TW)

TESTING APPARATUS - A simplified explanation of the abstract

This abstract first appeared for US patent application 18180101 titled 'TESTING APPARATUS

The testing apparatus described in the patent application consists of a circuit board, a probe station, and a probe array. The circuit board has multiple contacts, while the probe station includes a platform for holding a device under test (DUT) and a series of probe holes arranged in an array. The probe array comprises telescopic probes inserted into the probe holes, with one end of each probe making contact with a contact on the circuit board and the other end contacting a solder ball on the DUT. Each probe hole features an elongated groove, and each telescopic probe has a fin that inserts into this groove.

  • The testing apparatus includes a circuit board with multiple contacts.
  • A probe station with a platform for holding a DUT and probe holes in an array.
  • Telescopic probes in the probe array make contact with both the circuit board and the DUT.
  • Each probe hole has an elongated groove, and each telescopic probe has a fin that inserts into this groove.
  • The design allows for efficient and accurate testing of devices.

Potential Applications: - Testing electronic devices for functionality and performance. - Quality control in manufacturing processes. - Research and development in the electronics industry.

Problems Solved: - Ensures reliable and precise testing of devices. - Streamlines the testing process. - Facilitates quick identification of faults or issues in devices.

Benefits: - Improved accuracy in testing. - Time-saving in the testing process. - Enhanced quality control measures.

Commercial Applications: Title: Advanced Testing Apparatus for Electronics Industry This technology can be utilized in: - Electronics manufacturing companies. - Research and development labs. - Quality control departments in various industries.

Questions about the technology: 1. How does the telescopic probe design improve testing accuracy? 2. What are the potential cost-saving benefits of using this testing apparatus?


Original Abstract Submitted

A testing apparatus includes a circuit board, a probe station and a probe array. The circuit board includes a plurality of contacts. The probe station includes a platform located on the circuit board and used for carrying a device under test (DUT), and a plurality of probe holes formed on the platform and arranged in an array. The probe array includes a plurality of telescopic probes respectively linearly inserted into the probe holes. One end of each of the telescopic probes is contacted with one of the contacts, and the other end thereof is contacted with one of solder balls of the DUT. Each of the probe holes includes an elongated groove penetrating through the platform. Each of the telescopic probes is provided with a fin protruding outwardly and inserting into the elongated groove.

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