US Patent Application 17726965. DEPOSITING A STORAGE NODE simplified abstract

From WikiPatents
Jump to navigation Jump to search

DEPOSITING A STORAGE NODE

Organization Name

Micron Technology, Inc.


Inventor(s)

Ryan L. Meyer of Boise ID (US)


Vinay Nair of Boise ID (US)


Andrea Gotti of Boise ID (US)


Kevin Shea of Boise ID (US)


Kyle R. Knori of Boise ID (US)


DEPOSITING A STORAGE NODE - A simplified explanation of the abstract

  • This abstract for appeared for US patent application number 17726965 Titled 'DEPOSITING A STORAGE NODE'

Simplified Explanation

The abstract describes methods, apparatuses, and systems for depositing a storage node material. It explains that a semiconductor structure is formed, consisting of various layers such as silicate and nitride materials. Portions of the second nitride material are then removed, and a third silicate material is deposited over the remaining layers. An opening is formed through the semiconductor structure, and a storage node material is deposited within this opening.


Original Abstract Submitted

Methods, apparatuses, and systems related to depositing a storage node material are described. An example method includes forming a semiconductor structure including a support structure having a first silicate material over a bottom nitride material, a first nitride material over the first silicate material, a second silicate material over the first nitride material, and a second nitride material over the second silicate material. The method further includes removing portions of the second nitride material. The method further includes depositing a third silicate material over the second nitride material and a portion of the second silicate material. The method further includes forming an opening through the semiconductor structure. The method further includes depositing a storage node material within the opening.