View source for 17894715. METHOD FOR EVALUATING ELECTRIC POWER STORAGE DEVICE AND METHOD FOR MANUFACTURING ELECTRIC POWER STORAGE DEVICE simplified abstract (TOYOTA JIDOSHA KABUSHIKI KAISHA)

=METHOD FOR EVALUATING ELECTRIC POWER STORAGE DEVICE AND METHOD FOR MANUFACTURING ELECTRIC POWER STORAGE DEVICE=


==Organization Name==

[[:Category:TOYOTA JIDOSHA KABUSHIKI KAISHA|TOYOTA JIDOSHA KABUSHIKI KAISHA]]


[[Category:TOYOTA JIDOSHA KABUSHIKI KAISHA]]

==Inventor(s)==

[[:Category:Tomohiro Sekiya of Toyota-shi Aichi-ken (JP)|Tomohiro Sekiya of Toyota-shi Aichi-ken (JP)]][[Category:Tomohiro Sekiya of Toyota-shi Aichi-ken (JP)]]

[[:Category:Kensaku Miyazawa of Toyota-shi Aichi-ken (JP)|Kensaku Miyazawa of Toyota-shi Aichi-ken (JP)]][[Category:Kensaku Miyazawa of Toyota-shi Aichi-ken (JP)]]

[[:Category:Kazuo Tojima of Toyota-shi Aichi-ken (JP)|Kazuo Tojima of Toyota-shi Aichi-ken (JP)]][[Category:Kazuo Tojima of Toyota-shi Aichi-ken (JP)]]

[[:Category:Hitoshi Nakamura of Toyota-shi Aichi-ken (JP)|Hitoshi Nakamura of Toyota-shi Aichi-ken (JP)]][[Category:Hitoshi Nakamura of Toyota-shi Aichi-ken (JP)]]

[[:Category:Haruyoshi Sakakibara of Toyota-shi Aichi-ken (JP)|Haruyoshi Sakakibara of Toyota-shi Aichi-ken (JP)]][[Category:Haruyoshi Sakakibara of Toyota-shi Aichi-ken (JP)]]

[[:Category:Yasutaka Terashima of Toyota-shi Aichi-ken (JP)|Yasutaka Terashima of Toyota-shi Aichi-ken (JP)]][[Category:Yasutaka Terashima of Toyota-shi Aichi-ken (JP)]]

==METHOD FOR EVALUATING ELECTRIC POWER STORAGE DEVICE AND METHOD FOR MANUFACTURING ELECTRIC POWER STORAGE DEVICE - A simplified explanation of the abstract==


This abstract first appeared for US patent application 17894715 titled 'METHOD FOR EVALUATING ELECTRIC POWER STORAGE DEVICE AND METHOD FOR MANUFACTURING ELECTRIC POWER STORAGE DEVICE

==Simplified Explanation==

The abstract describes a method for evaluating an electric power storage device. Here is a simplified explanation of the abstract:

* The method involves causing a short circuit in the device by inserting a conductive probe into a stacked portion of electrode layers.
* After the short circuit occurs, the penetration depth of the probe is measured.
* The number of electrode layers involved in the short circuit is evaluated based on the penetration depth.
* The penetration depth is determined by measuring the length of the adhesion portion of the probe, which is the portion where the constituent material of the stacked portion adheres.

Potential Applications:

* This method can be used in the evaluation and testing of electric power storage devices, such as batteries or capacitors.
* It can help identify the number of electrode layers involved in a short circuit, which can be useful in diagnosing and troubleshooting issues in these devices.

Problems Solved:

* The method provides a way to evaluate the extent of a short circuit in an electric power storage device.
* It allows for the identification of the specific electrode layers involved in the short circuit.
* This information can help in understanding the cause of the short circuit and potentially finding solutions to prevent it in the future.

Benefits:

* The method provides a quantitative measure of the penetration depth, allowing for accurate evaluation of the short circuit.
* It offers a non-destructive way to assess the number of electrode layers involved in the short circuit.
* By understanding the extent of the short circuit, manufacturers can improve the design and performance of electric power storage devices.


==Original Abstract Submitted==

A method for evaluating an electric power storage device includes causing a short circuit by inserting an electrically conductive probe into a stacked portion in a thickness direction of electrode layers; measuring a penetration depth of the probe after the short circuit occurs; and evaluating the number of electrode layers involved in the short circuit based on the penetration depth. The penetration depth is identified by measuring a length of an adhesion portion in an axial direction of the probe. The adhesion portion is a portion of a surface of the probe to which a constituent material of the stacked portion adheres.



[[Category:G01R31/52]]
[[Category:G01R31/385]]