US Patent Application 18342145. SEMICONDUCTOR INTERCONNECT, ELECTRODE FOR SEMICONDUCTOR DEVICE, AND METHOD OF PREPARING MULTIELEMENT COMPOUND THIN FILM simplified abstract

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SEMICONDUCTOR INTERCONNECT, ELECTRODE FOR SEMICONDUCTOR DEVICE, AND METHOD OF PREPARING MULTIELEMENT COMPOUND THIN FILM

Organization Name

Samsung Electronics Co., Ltd.


Inventor(s)

Youngjae Kang of Suwon-si (KR)


SangWoon Lee of Suwon-si (KR)


Joungeun Yoo of Seongnam-si (KR)


Duseop Yoon of Seongnam-si (KR)


SEMICONDUCTOR INTERCONNECT, ELECTRODE FOR SEMICONDUCTOR DEVICE, AND METHOD OF PREPARING MULTIELEMENT COMPOUND THIN FILM - A simplified explanation of the abstract

  • This abstract for appeared for US patent application number 18342145 Titled 'SEMICONDUCTOR INTERCONNECT, ELECTRODE FOR SEMICONDUCTOR DEVICE, AND METHOD OF PREPARING MULTIELEMENT COMPOUND THIN FILM'

Simplified Explanation

The abstract describes a semiconductor interconnect and electrode for semiconductor devices. These components are made of a thin film material that is a multielement compound represented by Formula 1. The film has a thickness of 50 nm or less and a grain size to thickness ratio of 1.2 or greater. It also has a resistivity of 200 µΩ·cm or less.


Original Abstract Submitted

A semiconductor interconnect and an electrode for semiconductor devices may include a thin film including a multielement compound represented by Formula 1 and having a thickness equal to or less than about 50 nm, a grain size (A) to thickness (B) ratio (A/B) equal to or greater than about 1.2, and a resistivity equal to or less than about 200 µΩ·cm: