View source for US Patent Application 18020557. BRANCH RATIO MEASURING DEVICE, BRANCH RATIO MEASURING METHOD, AND OPTICAL MULTIPLEXING/DEMULTIPLEXING CIRCUIT MANUFACTURING METHOD simplified abstract

=BRANCH RATIO MEASURING DEVICE, BRANCH RATIO MEASURING METHOD, AND OPTICAL MULTIPLEXING/DEMULTIPLEXING CIRCUIT MANUFACTURING METHOD=


==Organization Name==

[[NIPPON TELEGRAPH AND TELEPHONE CORPORATION]]


==Inventor(s)==

[[Takui Uematsu of Musashino-shi, Tokyo (JP)]]


[[Hidenobu Hirota of Musashino-shi, Tokyo (JP)]]


[[Hiroyuki Iida of Musashino-shi, Tokyo (JP)]]


==BRANCH RATIO MEASURING DEVICE, BRANCH RATIO MEASURING METHOD, AND OPTICAL MULTIPLEXING/DEMULTIPLEXING CIRCUIT MANUFACTURING METHOD - A simplified explanation of the abstract==


*This abstract for appeared for US patent application  number 18020557 Titled 'BRANCH RATIO MEASURING DEVICE, BRANCH RATIO MEASURING METHOD, AND OPTICAL MULTIPLEXING/DEMULTIPLEXING CIRCUIT MANUFACTURING METHOD'

==Simplified Explanation==

The abstract describes a device, method, and manufacturing process for measuring branch ratios without the need for optical sources.


==Original Abstract Submitted==

The present disclosure is to provide a branch ratio measuring device, a branch ratio measuring method, and an optical multiplexer/demultiplexer circuit manufacturing method that do not require any optical sources for measurement.