US Patent Application 17840587. SYSTEMS, METHODS, AND APPARATUS FOR SELECTING DEVICES IN TIERED MEMORY simplified abstract

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SYSTEMS, METHODS, AND APPARATUS FOR SELECTING DEVICES IN TIERED MEMORY

Organization Name

Samsung Electronics Co., Ltd.


Inventor(s)

Jongmin Gim of Milpitas CA (US)


Yang Seok Ki of Palo Alto CA (US)


SYSTEMS, METHODS, AND APPARATUS FOR SELECTING DEVICES IN TIERED MEMORY - A simplified explanation of the abstract

  • This abstract for appeared for US patent application number 17840587 Titled 'SYSTEMS, METHODS, AND APPARATUS FOR SELECTING DEVICES IN TIERED MEMORY'

Simplified Explanation

This abstract describes a method for selecting and allocating memory pages in a memory tier that consists of two memory devices. The selection process is based on the parameters of each device, with the first memory device having a first parameter and the second memory device having a second parameter. The method involves determining a first result by combining the first parameter with a first weight, which includes a scale factor. The second result is determined based on the second parameter. These results are then compared to make the selection. Finally, the memory page is allocated from the selected first memory device based on the received request.


Original Abstract Submitted

A method may include receiving a request for a memory page in a memory tier comprising a first memory device and a second memory device, wherein the first memory device has a first parameter and the second memory device has a second parameter, selecting, based on the first parameter and the second parameter, the first memory device, and allocating, based on the request, based on the selecting, the memory page from the first memory device. The selecting may include determining a first result based on the first parameter, determining a second result based on the second parameter, and comparing the first result and the second result. The determining the first result may include combining the first parameter with a first weight. The first weight may include a first scale factor, and the combining the first parameter with the first weight may include multiplying the first parameter and the first scale factor.