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Bibliographic details for Taiwan semiconductor manufacturing co., ltd. (20240125713). Defect Inspection System and Method simplified abstract
- Page name: Taiwan semiconductor manufacturing co., ltd. (20240125713). Defect Inspection System and Method simplified abstract
- Author: WikiPatents contributors
- Publisher: WikiPatents, .
- Date of last revision: 26 April 2024 04:04 UTC
- Date retrieved: 19 May 2024 10:55 UTC
- Permanent URL: http://wikipatents.org/index.php?title=Taiwan_semiconductor_manufacturing_co.,_ltd._(20240125713)._Defect_Inspection_System_and_Method_simplified_abstract&oldid=56706
- Page Version ID: 56706
Citation styles for Taiwan semiconductor manufacturing co., ltd. (20240125713). Defect Inspection System and Method simplified abstract
APA style
Taiwan semiconductor manufacturing co., ltd. (20240125713). Defect Inspection System and Method simplified abstract. (2024, April 26). WikiPatents, . Retrieved 10:55, May 19, 2024 from http://wikipatents.org/index.php?title=Taiwan_semiconductor_manufacturing_co.,_ltd._(20240125713)._Defect_Inspection_System_and_Method_simplified_abstract&oldid=56706.
MLA style
"Taiwan semiconductor manufacturing co., ltd. (20240125713). Defect Inspection System and Method simplified abstract." WikiPatents, . 26 Apr 2024, 04:04 UTC. 19 May 2024, 10:55 <http://wikipatents.org/index.php?title=Taiwan_semiconductor_manufacturing_co.,_ltd._(20240125713)._Defect_Inspection_System_and_Method_simplified_abstract&oldid=56706>.
MHRA style
WikiPatents contributors, 'Taiwan semiconductor manufacturing co., ltd. (20240125713). Defect Inspection System and Method simplified abstract', WikiPatents, , 26 April 2024, 04:04 UTC, <http://wikipatents.org/index.php?title=Taiwan_semiconductor_manufacturing_co.,_ltd._(20240125713)._Defect_Inspection_System_and_Method_simplified_abstract&oldid=56706> [accessed 19 May 2024]
Chicago style
WikiPatents contributors, "Taiwan semiconductor manufacturing co., ltd. (20240125713). Defect Inspection System and Method simplified abstract," WikiPatents, , http://wikipatents.org/index.php?title=Taiwan_semiconductor_manufacturing_co.,_ltd._(20240125713)._Defect_Inspection_System_and_Method_simplified_abstract&oldid=56706 (accessed May 19, 2024).
CBE/CSE style
WikiPatents contributors. Taiwan semiconductor manufacturing co., ltd. (20240125713). Defect Inspection System and Method simplified abstract [Internet]. WikiPatents, ; 2024 Apr 26, 04:04 UTC [cited 2024 May 19]. Available from: http://wikipatents.org/index.php?title=Taiwan_semiconductor_manufacturing_co.,_ltd._(20240125713)._Defect_Inspection_System_and_Method_simplified_abstract&oldid=56706.
Bluebook style
Taiwan semiconductor manufacturing co., ltd. (20240125713). Defect Inspection System and Method simplified abstract, http://wikipatents.org/index.php?title=Taiwan_semiconductor_manufacturing_co.,_ltd._(20240125713)._Defect_Inspection_System_and_Method_simplified_abstract&oldid=56706 (last visited May 19, 2024).
BibTeX entry
@misc{ wiki:xxx,
author = "WikiPatents",
title = "Taiwan semiconductor manufacturing co., ltd. (20240125713). Defect Inspection System and Method simplified abstract --- WikiPatents{,} ",
year = "2024",
url = "http://wikipatents.org/index.php?title=Taiwan_semiconductor_manufacturing_co.,_ltd._(20240125713)._Defect_Inspection_System_and_Method_simplified_abstract&oldid=56706",
note = "[Online; accessed 19-May-2024]"
}
When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred:
@misc{ wiki:xxx,
author = "WikiPatents",
title = "Taiwan semiconductor manufacturing co., ltd. (20240125713). Defect Inspection System and Method simplified abstract --- WikiPatents{,} ",
year = "2024",
url = "\url{http://wikipatents.org/index.php?title=Taiwan_semiconductor_manufacturing_co.,_ltd._(20240125713)._Defect_Inspection_System_and_Method_simplified_abstract&oldid=56706}",
note = "[Online; accessed 19-May-2024]"
}
