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Bibliographic details for 17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)

Citation styles for 17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)

APA style

17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.). (2024, January 2). WikiPatents, . Retrieved 16:27, May 19, 2024 from http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288.

MLA style

"17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)." WikiPatents, . 2 Jan 2024, 17:51 UTC. 19 May 2024, 16:27 <http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288>.

MHRA style

WikiPatents contributors, '17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)', WikiPatents, , 2 January 2024, 17:51 UTC, <http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288> [accessed 19 May 2024]

Chicago style

WikiPatents contributors, "17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)," WikiPatents, , http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288 (accessed May 19, 2024).

CBE/CSE style

WikiPatents contributors. 17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.) [Internet]. WikiPatents, ; 2024 Jan 2, 17:51 UTC [cited 2024 May 19]. Available from: http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288.

Bluebook style

17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.), http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288 (last visited May 19, 2024).

BibTeX entry

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.) --- WikiPatents{,} ",
   year = "2024",
   url = "http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288",
   note = "[Online; accessed 19-May-2024]"
 }

When using the LaTeX package url (\usepackage{url} somewhere in the preamble) which tends to give much more nicely formatted web addresses, the following may be preferred: 

 @misc{ wiki:xxx,
   author = "WikiPatents",
   title = "17725917. METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.) --- WikiPatents{,} ",
   year = "2024",
   url = "\url{http://wikipatents.org/index.php?title=17725917._METHOD_OF_INSPECTING_A_WAFER_AND_APPARATUS_FOR_PERFORMING_THE_SAME_simplified_abstract_(Samsung_Electronics_Co.,_Ltd.)&oldid=21288}",
   note = "[Online; accessed 19-May-2024]"
 }


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