Sk hynix inc. (20240120015). SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST simplified abstract
Contents
- 1 SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST
Organization Name
Inventor(s)
Choung Ki Song of Icheon-si Gyeonggi-do (KR)
SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240120015 titled 'SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST
Simplified Explanation
The semiconductor device described in the patent application includes a self-test circuit that generates an internal clock with a higher frequency than an external clock, extracts an instruction signal from a pre-instruction signal through a data line, and generates an internal control signal from the instruction signal. Additionally, there is a command control circuit that generates a test command to perform a self-test on first and second memory cells to determine if a defect has occurred, based on the internal clock and internal control signal. A data control circuit outputs data stored in the first memory cells based on the test command and stores data output from the first memory cells in the second memory cells.
- Self-test circuit generates internal clock with higher frequency than external clock
- Command control circuit generates test command for self-test on memory cells
- Data control circuit outputs and stores data in memory cells
Potential Applications
The technology described in the patent application could be applied in various semiconductor devices, such as microcontrollers, memory chips, and processors.
Problems Solved
This technology helps in detecting defects in memory cells and ensures the proper functioning of the semiconductor device.
Benefits
The benefits of this technology include improved reliability and performance of semiconductor devices, as well as efficient self-testing capabilities.
Potential Commercial Applications
The technology could be used in consumer electronics, automotive systems, industrial automation, and other applications where reliable semiconductor devices are required.
Possible Prior Art
One possible prior art could be the use of self-test circuits in semiconductor devices for error detection and correction purposes.
Unanswered Questions
How does this technology compare to existing self-test circuits in terms of speed and accuracy?
The article does not provide a direct comparison between this technology and existing self-test circuits in terms of speed and accuracy.
What are the potential limitations of implementing this technology in semiconductor devices?
The article does not address the potential limitations of implementing this technology in semiconductor devices, such as cost or complexity.
Original Abstract Submitted
a semiconductor device includes a self-test circuit configured to generate an internal clock having a higher frequency than a clock applied from a device external to the semiconductor device, to generate an instruction signal from a pre-instruction signal extracted through a data line, and to generate an internal control signal from the instruction signal. the semiconductor device also includes a command control circuit configured to generate a test command to perform a self-test for determining whether a defect has occurred in first memory cells and second memory cells based on the internal clock and the internal control signal. the semiconductor device further includes a data control circuit configured to output data stored in the first memory cells based on the test command, and to store data output from the first memory cells in the second memory cells.
