View source for Samsung electronics co., ltd. (20240135523). SEMICONDUCTOR YIELD PREDICTION METHOD AND APPARATUS simplified abstract

=SEMICONDUCTOR YIELD PREDICTION METHOD AND APPARATUS=


==Organization Name==

[[:Category:samsung electronics co., ltd.|samsung electronics co., ltd.]]


[[Category:samsung electronics co., ltd.]]

==Inventor(s)==

[[:Category:Taesoo Shin of Suwon-si (KR)|Taesoo Shin of Suwon-si (KR)]][[Category:Taesoo Shin of Suwon-si (KR)]]

[[:Category:Seulgi Ok of Suwon-si (KR)|Seulgi Ok of Suwon-si (KR)]][[Category:Seulgi Ok of Suwon-si (KR)]]

[[:Category:Kibum Lee of Suwon-si (KR)|Kibum Lee of Suwon-si (KR)]][[Category:Kibum Lee of Suwon-si (KR)]]

[[:Category:Sungwook Hwang of Suwon-si (KR)|Sungwook Hwang of Suwon-si (KR)]][[Category:Sungwook Hwang of Suwon-si (KR)]]

==SEMICONDUCTOR YIELD PREDICTION METHOD AND APPARATUS - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240135523 titled 'SEMICONDUCTOR YIELD PREDICTION METHOD AND APPARATUS

==Simplified Explanation==

The patent application describes a method of predicting semiconductor yield by analyzing wafer level data, generating virtual chips, mapping test results, computing defect rates, and calculating a defect index of the equipment.

* Analyzing wafer level data to predict semiconductor yield
* Generating virtual chips based on wafer level data
* Mapping test results to virtual chips
* Computing defect rates based on test results
* Calculating a defect index of the equipment

== Potential Applications ==
This technology can be applied in semiconductor manufacturing to improve yield prediction and quality control processes.

== Problems Solved ==
This technology helps in identifying defects in semiconductor chips early in the manufacturing process, allowing for timely corrective actions to be taken.

== Benefits ==
The method can lead to increased efficiency in semiconductor manufacturing, reduced waste, and improved overall product quality.

== Potential Commercial Applications ==
One potential commercial application of this technology could be in the semiconductor industry for optimizing production processes and reducing costs.

== Possible Prior Art ==
One possible prior art could be similar methods used in the semiconductor industry for yield prediction and quality control, but this specific combination of steps may be novel.

== Unanswered Questions ==

=== How does this method compare to traditional yield prediction techniques in terms of accuracy and efficiency? ===
The article does not provide a direct comparison between this method and traditional techniques, leaving the reader to wonder about the potential advantages or limitations of this approach.

=== Are there any specific industries or sectors where this technology would be most beneficial? ===
The article does not mention any specific industries or sectors where this technology could have the most significant impact, leaving room for exploration of potential applications beyond semiconductor manufacturing.


==Original Abstract Submitted==

a method of predicting a semiconductor yield includes receiving wafer level data generated by measuring a plurality of wafers, generating a plurality of virtual chips corresponding to the plurality of wafers based on the wafer level data, mapping a test result of the plurality of wafers to the plurality of virtual chips, computing a defect rate of the plurality of virtual chips according to defects based on a result of the mapping, and computing a defect index of the equipment based on the defect rate.



[[Category:G06T7/00]]