Samsung electronics co., ltd. (20240125841). TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT simplified abstract
Contents
- 1 TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Unanswered Questions
- 1.11 Original Abstract Submitted
TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT
Organization Name
Inventor(s)
Cheongwon Lee of Suwon-si (KR)
Youngwoo Park of Suwon-si (KR)
Seunghoon Lee of Suwon-si (KR)
TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240125841 titled 'TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT
Simplified Explanation
The embodiment described in the abstract is a test element group (TEG) circuit that includes a first pad for a test voltage, an amplifier, a variable resistor, and a gate driving circuit for a test transistor.
- The first pad is used to apply a test voltage.
- The amplifier has input terminals connected to the first pad and the test transistor, and an output terminal connected to the variable resistor.
- The variable resistor is connected between the output terminal of the amplifier and the test transistor.
- The gate driving circuit supplies a gate voltage to the test transistor.
Potential Applications
This technology could be used in semiconductor testing equipment, integrated circuit design, and electronic component manufacturing.
Problems Solved
This technology helps in accurately testing transistors and other electronic components, ensuring their proper functioning in various applications.
Benefits
The TEG circuit allows for precise testing of transistors, leading to improved quality control in semiconductor production processes.
Potential Commercial Applications
Potential commercial applications include semiconductor testing equipment, electronic component manufacturing, and integrated circuit design services.
Possible Prior Art
One possible prior art could be similar TEG circuits used in semiconductor testing equipment or integrated circuit design.
Unanswered Questions
How does this technology compare to existing transistor testing methods?
This technology offers a more precise and efficient way to test transistors compared to traditional methods. It allows for better control and accuracy in the testing process.
What are the potential cost implications of implementing this technology in semiconductor production?
The implementation of this technology may involve initial costs for equipment and training, but the long-term benefits of improved quality control and efficiency could outweigh these costs.
Original Abstract Submitted
an embodiment provides a test element group (teg) circuit, including: a first pad configured for a test voltage to be applied; an amplifier including a first input terminal connected to the first pad, a second input terminal connected to a first terminal of a test transistor, and an output terminal electrically connected to the second input terminal; a variable resistor including one terminal connected to the output terminal of the amplifier and the other terminal connected to the first terminal of the test transistor; and a gate driving circuit that supplies a gate voltage to a gate of the test transistor.
